THS770006 Datasheet, PDF (3/39 Pages) National Semiconductor (TI) – Broadband, Fully-Differential, 14-/16-Bit ADC DRIVER AMPLIFIER

THS770006
www.ti.com
SBOS520B – JULY 2010 – REVISED JANUARY 2012
THERMAL INFORMATION
THERMAL METRIC⁽¹⁾
THS770006
RGE
UNITS
24 PINS
θ_JA
θ_JC(top)
θ_JB
ψ_JT
ψ_JB
θ_JC(bottom)
Junction-to-ambient thermal resistance
Junction-to-case(top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case(bottom) thermal resistance
44.1
35
19
°C/W
0.5
18.8
8.9
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
ELECTRICAL CHARACTERISTICS
Test conditions are at T_A = +25°C, V_S+ = +5V, V_OCM = +2.5V, V_OUT = 2V_PP, R_L = 400Ω differential, G = +6dB, differential input
and output, and input and output referenced to midsupply, unless otherwise noted. Measured using evaluation module as
discussed in Test Circuits section.
PARAMETER
AC PERFORMANCE
Small-signal bandwidth
Large-signal bandwidth
Bandwidth for 0.1dB flatness
Slew rate
Rise time
Fall time
Settling time to 0.1%
Input return loss, s11
Output return loss, s22
Reverse isolation, s12
Second-order harmonic
distortion
Third-order harmonic distortion
Second-order intermodulation
distortion
Third-order intermodulation
distortion
1dB compression point
TEST CONDITIONS
V_OUT = 200mV_PP
V_OUT = 2V_PP
V_OUT = 3V_PP
V_OUT = 2V_PP
V_OUT = 3V_PP
V_OUT = 2V step
V_OUT = 4V step
V_OUT = 2V step
V_OUT = 2V step
V_OUT = 2V step
See s-Parameters section, f < 200MHz
See s-Parameters section, f < 200MHz
See s-Parameters section, f < 200MHz
f = 10MHz
f = 50MHz
f = 100MHz
f = 200MHz
f = 10MHz
f = 50MHz
f = 100MHz
f = 200MHz
f = 50MHz, 10MHz spacing
f = 100MHz, 10MHz spacing
f = 150MHz, 10MHz spacing
f = 200MHz, 10MHz spacing
f = 50MHz, 10MHz spacing
f = 100MHz, 10MHz spacing
f = 150MHz, 10MHz spacing
f = 200MHz, 10MHz spacing
f = 100MHz
R_L = 20Ω
R_L = 400Ω
TEST
MIN
TYP
MAX
UNIT
LEVEL ⁽¹⁾
2.4
780
485
360
325
3100
3200
0.6
0.6
2.2
–20
–20
–70
–87
–81
–78
–74
–103
–91
–86
–77
–80
–79
–77
–76
–107
–107
–97
–82
19.6
8.7
GHz
C
MHz
C
MHz
C
MHz
C
MHz
C
V/µs
C
V/µs
C
ns
C
ns
C
ns
C
dB
C
dB
C
dB
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBm
C
dBm
C
(1) Test levels: (A) 100% tested at +25°C. Over-temperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
Copyright © 2010–2012, Texas Instruments Incorporated
Submit Documentation Feedback
3
Product Folder Link(s): THS770006