LMC2001 Datasheet, PDF (3/11 Pages) National Semiconductor (TI) – High Precision, 6MHz Rail-To-Rail Output Operational Amplifier

AC Electrical Characteristics
T_J = 25˚C, V⁺ = 5V, V ^- = 0V, V_CM = 2.5V, V_O = 2.5V, and R_L > 1MΩ.
Symbol Parameter
Conditions
SR
GBW
θ_m
G_m
e_n
Slew Rate
Gain-Bandwidth Product
Phase Margin
Gain Margin
Input-Referred Voltage Noise
A_V = +1, V_in=3.5Vpp
f = 0.1Hz
Typ
(Note 5)
5
6
75
12
85
Units
V/µs
MHz
Deg
dB
nV/
e_np-p
i_n
Input-Referred Voltage Noise R_S = 100Ω, DC to 10Hz
Input-Referred Current Noise f = 0.1Hz
1.6
µVpp
180
fA/
THD
trec
Total Harmonic Distortion
f = 1kHz, Av = -2
R_L = 10kΩ,V_O = 4.5Vpp
Input Overload Recovery Time
0.02
%
50
ms
T_S
Output Settling time
(Note 10) A_V= +1, 1V step
1%
0.1%
250
ns
400
0.01%
3200
(Note 10)A_V= −1, 1V step
1%
80
0.1%
860
0.01%
1400
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is in-
tended to be functional, but specific performance is not guaranteed. For guaranteed specifications and test conditions, see the Electrical Characteristics.
Note 2: Human body model, 1.5kΩ in series with 100pF. Machine model, 200Ω in series with 100pF.
Note 3: Output currents in excess of ±30mA over long term may adversely affect reliability.
Note 4: The maximum power dissipation is a function of T_J(max), θ _JA, and T_A. The maximum allowable power dissipation at any ambient temperature is P_D = (T_J(max)
- T_A)/θ _JA. All numbers apply for packages soldered directly onto a PC board.
Note 5: Typical values represent the most likely parametric norm.
Note 6: All limits are guaranteed by testing or statistical analysis, unless otherwise noted.
Note 7: V⁺ = 5V, V_CM = 2.5V, and R_L connected to 2.5V. For Sourcing tests, 2.5V ≤ V_O ≤ 4.8V. For Sinking tests, 0.2V ≤ V _O ≤ 2.5V.
Note 8: Guaranteed Vos Drift is based on 280 devices operated for 1000 hrs at 150˚C (equivalent to 30 years 55ºC).
Note 9: Guaranteed by design only.
Note 10: Settling times shown correspond to the worse case (positive or negative step) and does not include slew time. See the Application Note section for test
schematic.
Note 11: The limits are set by the accuracy of high speed automatic test equipment. For the typical V_OS distribution, see the curve on page 4.
Note 12: Precision bench measurement of more than 300 units. More than 65% of units had less than 15nV /˚C V_OS drift.
3
www.national.com