DS90LV028AQ Datasheet, PDF (3/10 Pages) National Semiconductor (TI) – Automotive LVDS Dual Differential Line Receiver

Note 7: Output short circuit current (I_OS) is specified as magnitude only, minus sign indicates direction only. Only one output should be shorted at a time, do not
exceed maximum junction temperature specification.
Note 8: C_L includes probe and jig capacitance.
Note 9: Generator waveform for all tests unless otherwise specified: f = 1 MHz, Z_O = 50Ω, t_r and t_f (0% to 100%) ≤ 3 ns for R_IN.
Note 10: t_SKD1 is the magnitude difference in differential propagation delay time between the positive-going-edge and the negative-going-edge of the same
channel.
Note 11: t_SKD2 is the differential channel-to-channel skew of any event on the same device. This specification applies to devices having multiple receivers within
the integrated circuit.
Note 12: t_SKD3, part to part skew, is the differential channel-to-channel skew of any event between devices. This specification applies to devices at the same
V_CC and within 5°C of each other within the operating temperature range.
Note 13: t_SKD4, part to part skew, is the differential channel-to-channel skew of any event between devices. This specification applies to devices over the
recommended operating temperature and voltage ranges, and across process distribution. t_SKD4 is defined as |Max − Min| differential propagation delay.
Note 14: f_MAX generator input conditions: t_r = t_f < 1 ns (0% to 100%), 50% duty cycle, differential (1.05V to 1.35 peak to peak). Output criteria: 60%/40% duty
cycle, V_OL (max 0.4V), V_OH (min 2.7V), load = 15 pF (stray plus probes).
Parameter Measurement Information
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FIGURE 1. Receiver Propagation Delay and Transition Time Test Circuit
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FIGURE 2. Receiver Propagation Delay and Transition Time Waveforms
Typical Application
Balanced System
FIGURE 3. Point-to-Point Application
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