DS14C88T Datasheet, PDF (3/6 Pages) National Semiconductor (TI) – QUAD CMOS Line Driver

Switching Characteristics
Over Recommended Operating Conditions unless otheriwse specified (Figures 2 and 3 ) (Notes 5 and 6)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
t_PLH
Propagation Delay
Low to High
V^a e a4 5V V^b e b4 5V
V^a e a9 0V V^b e b9 0V
15
60
ms
12
50
ms
V^a e a12V V^b e b12V
12
40
ms
t_PHL
Propagation Delay
High to Low
V^a e a4 5V V^b e b4 5V
V^a e a9 0V V^b e b9 0V
15
60
ms
1 35
50
ms
V^a e a12V V^b e b12V
13
40
ms
t_r
Rise Time (Note 7)
02
10
ms
t_f
Fall Time (Note 7)
02
10
ms
tsk
Typical Propagation
V^a e a4 5V V^b e b4 5V
250
ns
Delay Skew
V^a e a9 0V V^b e b9 0V
200
ns
V^a e a12V V^b e b12V
150
ns
S_R
Output Slew Rate
R_L e 3 kX to 7 kX
(Note 7)
C_L e 15 pF to 2500 pF
30
V ms
Note 1 ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed They are not meant to imply that the devices
should be operated at these limits The tables of ‘‘Electrical Characteristics’’ specify conditions for device operation
Note 2 Derate N Package 12 1 mW C J Package 12 9 mW C and M Package 8 5 mW C above a25 C
Note 3 I_OSa and I_OSb values are for one output at a time If more than one output is shorted simultaneously the device dissipation may be exceeded
Note 4 Power supply (V^a V^b) and GND pins are connected to ground for the Output Resistance Test (R_O)
Note 5 AC input test waveforms for test purposes t_r e t_f s 20 ns V_IH e 2V V_IL e 0 8V (0 6V at V^a e 4 5V V^b e b4 5V)
Note 6 Input rise and rall times must not exceed 5 ms
Note 7 The output slew rate rise time and fall time are measured from the a3 0V to the b3 0V level on the output waveform
Note 8 C_L include jig and probe capacitances
Note 9 ESD Rating (HBM 1 5 kX 100 pF) t 1 0 kV
3
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