CD4009C Datasheet, PDF (2/4 Pages) National Semiconductor (TI) – Hex Buffers (Inverting)

Absolute Maximum Ratings
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Voltage at Any Pin (Note 1) V_SS b 0 3V to V_SS a15 5V
Operating Temperature Range
CD40XXM
b55 C to a125 C
CD40XXC
b45 C to a85 C
Storage Temperature Range (T_S)
Power Dissipation (P_D)
Dual-In-Line
Small Outline
b65 C to a150 C
700 mW
500 mW
Lead Temperature (T_L)
(Soldering 10 seconds)
260 C
Operating Range (V_DD)
V_SS a 3V to V_SS a 15V
DC Electrical Characteristics
Symbol Characteristics
Test
Conditions
(Volts)
b55 C
CD40XXM
a25 C
Limits
a125 C b40 C
CD40XXC
a25 C
Units
a85 C
I_CC Quiescent Device
Current
V_O V_DD Min Max Min Typ Max Min Max Min Max Min Typ Max Min Max
5
03
0 01 0 3
20
10
05
0 01 0 5
30
3
0 03 3
5
0 05 5
42 mA
70 mA
P_D
Quiescent Device
Dissipation Package
5
15
0 05 1 5
100
15
0 15 15
210 mW
10
5
01 5
300
50
0 5 50
700 mW
Output Voltage
V_OL Low Level
V_OH High Level
5
0 01
10
0 01
5 4 99
4 99
10 9 99
9 99
0 0 01
0 05
0 01
0 0 01
0 05 V
0 0 01
0 05
0 01
0 0 01
0 05 V
5
4 95
4 99
4 99 5
4 95
V
10
9 95
9 99
9 99 10
9 95
V
Noise Immunity
(All Inputs)
V_NL
CD4009M
V_O ^t 4 0 5 1
V_O ^t 8 0 10 2
1 2 25
09
1
2 45
19
2
1 2 25
09
V
2 45
19
V
V_NL
CD4010M
V_O ^t 1 5 5 1 6
V_O ^t 3 0 10 3 2
1 5 2 25
14
16
3 45
29
32
1 5 2 25
14
3 45
29
V
V
V_NH
V_O ^t 3 5 5 1 4
1 5 2 25
15
14
1 5 2 25
15
V
V_O ^t 7 0 10 2 9
3 45
3
29
3 45
3
V
Output Drive Current 0 4
I_DN N-Channel (Note 2)
05
I_DP P-Channel (Note 2)
25
95
5 3 75
10 10
5 b1 85
10 b0 9
34
8 10
b1 25 b1 75
b0 6 b0 8
21
56
b0 9
b0 4
36
96
b1 5
b0 72
3
8
b1 25
b0 6
24
mA
64
mA
b1
mA
b0 48
mA
I_IN
Input Current
10
10
pA
Note 1 This device should not be connected to circuits with the power on because high transient voltage may cause permanent damage
Note 2 I_DN and I_DP are tested one output at a time
AC Electrical Characteristics
T_A e 25 c C_L e 15 pF unless otherwise noted Typical Temperature coefficient for all values of V_DD e 0 3% C
Characteristics
Test
Conditions
V_DD
(Volts)
CD40XXM
Limits
CD40XXC
Min
Typ
Max
Min
Typ
Max
Propagation Delay Time
High-to-Low Level (t_PHL)
V_CC e V_DD
5
10
V_DD e 10V
V_CC e 5V
Low-to-High Level (t_PLH)
V_CC e V_DD
5
10
V_DD e 10V
V_CC e 5V
Transition Time
High-to-Low Level (t_THL)
V_CC e V_DD
5
10
Low-to-High Level (t_TLH)
V_CC e V_DD
5
10
Input Capacitance (C_I)
Any Input
AC Parameters are guaranteed by DC correlated testing
15
55
10
30
10
25
50
80
25
55
15
30
20
45
16
40
80
125
50
100
5
15
70
10
40
10
35
50
100
25
70
15
40
20
60
16
50
80
160
50
120
5
Units
ns
ns
ns
ns
pF
2