NM95HS01 Datasheet, PDF (15/20 Pages) National Semiconductor (TI) – HiSeC-TM High Security Rolling Code Generator

NM95HS01 02 DC and AC Electrical Characteristics
2 5V ^s V_CC ^s 6 5V (unless otherwise specified) (Continued)
Symbol
Parameter
Conditions
Min Typ Max Units
t_CKI
Clock Period Time
(Note 4)
XTAL Clock
RC Clock
2000
2000
DC
ns
DC
ns
t_CKIH
Clock High Time
(Note 4)
XTAL Clock
RC Clock
1000
1000
DC
ns
DC
ns
t_CKIL
Clock Low Time
(Note 4)
XTAL Clock
RC Clock
1000
1000
DC
ns
DC
ns
t_DAR
Data Access Time
t_DAR e t_CKIH a t_DALR
11
ms
t_DALR
Data Access Time Low
100
ns
t_ENDR
End Read Time
10
ms
t_SVLR
K1 Supervoltage Low Time (Read)
10
ms
t_XR
Exit Read Time
10
ms
Note 1 Stresses above those listed under ‘‘Absolute Maximum Ratings’’ may cause permanent damage to the device This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the operational sections of the specification is not implied Exposure to absolute
maximum rating conditions for extended periods may affect device reliability
Note 2 The standby current of k1 mA is tested at 3V During HALT Mode only a very small current is required to maintain the code in the shift registers HALT
mode is exited by depressing one of the input keys
Note 3 The clock rate used to program the NM95HS01 02 is generally less than the normal operating mode clock rate and should be temporarily reduced as
necessary to meet the programming specifications shown here For example a generator might normally operate at 4 MHz but should be programmed at
s0 5 MHz (2000 ns)
Note 4 Parameter characterized but not 100% tested
Capacitance T_A e a25 C f e 1 MHz (Note 2)
Symbol
Test
Max Units
C_IN
Input Capacitance
7
pF
C_OUT
0utput Capacitance
12
pF
Typical Halt Mode Current (nA) vs Voltage over Temperature
TL D 12302 – 23
15
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