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SCANPSC110F Datasheet, PDF (1/29 Pages) National Semiconductor (TI) – SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) | |||
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October 1999
SCANPSC110F
SCAN Bridge Hierarchical and Multidrop Addressable
JTAG Port (IEEE1149.1 System Test Support)
General Description
The SCANPSC110F Bridge extends the IEEE Std. 1149.1
test bus into a multidrop test bus environment. The advan-
tage of a hierarchical approach over a single serial scan
chain is improved test throughput and the ability to remove a
board from the system and retain test access to the remain-
ing modules. Each SCANPSC110F Bridge supports up to 3
local scan rings which can be accessed individually or com-
bined serially. Addressing is accomplished by loading the in-
struction register with a value matching that of the Slot in-
puts. Backplane and inter-board testing can easily be
accomplished by parking the local TAP Controllers in one of
the stable TAP Controller states via a Park instruction. The
32-bit TCK counter enables built in self test operations to be
performed on one port while other scan chains are simulta-
neously tested.
n The 6 slot inputs support up to 59 unique addresses, a
Broadcast Address, and 4 Multi-cast Group Addresses
n 3 IEEE 1149.1-compatible configurable local scan ports
n Mode Register allows local TAPs to be bypassed,
selected for insertion into the scan chain individually, or
serially in groups of two or three
n 32-bit TCK counter
n 16-bit LFSR Signature Compactor
n Local TAPs can be tri-stated via the OE input to allow
an alternate test master to take control of the local TAPs
n The IP version of this device supports features not
described in this datasheet such as 8 slot inputs for
enhanced address capability and additional instructions.
For a completed description of the additional instructions
supported, refer to the SCANPSC110 supplemental
datasheet.
Features
n True IEEE1149.1 hierarchical and multidrop addressable
capability
Connection Diagrams
28-Pin
CDIP and Flatpak
Pin Assignment for LCC
DS100327-1
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 1999 National Semiconductor Corporation DS100327
DS100327-2
www.national.com
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