SCAN18245T Datasheet, PDF (1/16 Pages) National Semiconductor (TI) – Non-Inverting Transceiver with TRI-STATE Outputs

September 1998
SCAN18245T
Non-Inverting Transceiver with TRI-STATE^® Outputs
General Description
The SCAN18245T is a high speed, low-power bidirectional
line driver featuring separate data inputs organized into dual
9-bit bytes with byte-oriented output enable and direction
control signals. This device is compliant with IEEE 1149.1
Standard Test Access Port and Boundary Scan Architecture
with the incorporation of the defined boundary-scan test
logic and test access port consisting of Test Data Input (TDI),
Test Data Out (TDO), Test Mode Select (TMS), and Test
Clock (TCK).
Features
n IEEE 1149.1 (JTAG) Compliant
n Dual output enable control signals
n TRI-STATE outputs for bus-oriented applications
n 9-bit data busses for parity applications
n Reduced-swing outputs source 24 mA/sink 48 mA
n Guaranteed to drive 50Ω transmission line to TTL input
levels of 0.8V and 2.0V
n TTL compatible inputs
n 25 mil pitch Cerpack package
n Includes CLAMP and HIGHZ instructions
n Available as Known Good Die
n Standard Microcircuit Drawing (SMD) 5962-9311501
Connection Diagram
Pin Names
B1_(0–8)
A2_(0–8)
B2_(0–8)
G1, G2
DIR1, DIR2
Description
Side B1 Inputs or TRI-STATE Outputs
Side A2 Inputs or TRI-STATE Outputs
Side B2 Inputs or TRI-STATE Outputs
Output Enable Pins
Direction of Data Flow Pins
DS100320-1
Pin Names
Description
A1_(0–8)
Side A1 Inputs or TRI-STATE Outputs
TRI-STATE^® is a registered trademark of National Semiconductor Corporation.
© 1998 National Semiconductor Corporation DS100320
www.national.com