SCAN16602 Datasheet, PDF (1/9 Pages) National Semiconductor (TI) – Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE-R Outputs

July 2003
SCAN16602
Low Voltage Universal 16-bit IEEE 1149.1 Bus
Transceiver with TRI-STATE^® Outputs
General Description
The SCAN16602 is a high speed, low-power universal bus
transceiver featuring data inputs organized into two 8-bit
bytes with separate output enable and latch enable control
signals. The byte-wide output enable controls are compli-
mentary to allow direction control with a single R/W line and
no additional logic. This function is configurable as a D-type
Latch or Flip-Flop, and can operate in transparent, latched,
or clocked mode. This device is compliant with IEEE 1149.1
Standard Test Access Port and Boundary Scan Architecture
with the incorporation of the defined boundary-scan test
logic and test access port consisting of Test Data Input (TDI),
Test Data Out (TDO), Test Mode Select (TMS), Test Clock
(TCK), and Test Reset (TRST).
Features
n IEEE 1149.1 (JTAG) Compliant
n 2.7V to 3.6V V_CC Operation
n TRI-STATE outputs for bus-oriented applications
n Dual byte-wide data for bus applications
n Power down high Impedance inputs and outputs
n Optional Bus Hold on data inputs eliminates the need
for external pullup/pulldown resistors (SCANH16602,
SCANH162602 versions)
n Optional 25Ω series resistors in outputs to minimize
noise and eliminate termination resistors (SCAN162602,
SCANH162602 versions)
n Supports live insertion/withdrawal
n Includes CLAMP and HIGHZ instructions
Block Diagram
TRI-STATE^® is a registered trademark of National Semiconductor Corporation.
© 2003 National Semiconductor Corporation DS200518
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