SCAN16512 Datasheet, PDF (1/10 Pages) National Semiconductor (TI) – Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs

August 2002
SCAN16512
Low Voltage Universal 16-bit IEEE 1149.1 Bus
Transceiver with TRI-STATE Outputs
General Description
The SCAN16512 is a high speed, low-power universal bus
transceiver featuring data inputs organized into two 8-bit
bytes with output enable and latch enable control signals.
This function is configurable as a D-type Latch or Flip-Flop,
and can operate in transparent, latched, or clocked mode.
This device is compliant with IEEE 1149.1 Standard Test
Access Port and Boundary Scan Architecture with the incor-
poration of the defined boundary-scan test logic and test
access port consisting of Test Data Input (TDI), Test Data
Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and
Test Reset (TRST).
Features
n IEEE 1149.1 (JTAG) Compliant
n 2.7V to 3.6V V_CC Operation
n TRI-STATE outputs for bus-oriented applications
n Dual byte-wide data for bus applications
n Power down high Impedance inputs and outputs
n Optional Bus Hold on data inputs eliminates the need
for external pullup/pulldown resistors (SCANH16512,
SCANH162512 versions)
n Optional 25Ω series resistors in outputs to minimize
noise and eliminate termination resistors (SCAN162512,
SCANH162512 versions)
n Supports live insertion/withdrawal
n Includes CLAMP and HIGHZ instructions
Block Diagram
© 2002 National Semiconductor Corporation DS200266
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