MNLM101A-X Datasheet, PDF (1/5 Pages) National Semiconductor (TI) – OPERATION AMPLIFIER

MNLM101A-X REV 0A0
MICROCIRCUIT DATA SHEET
Original Creation Date: 06/21/95
Last Update Date: 03/17/97
Last Major Revision Date: 02/18/97
OPERATION AMPLIFIER
General Description
The LM101A is a general purpose operational amplifier which features improved performance
over industry standards such as the LM709. Advanced processing techniques make possible an
order of magnitude reduction in input currents, and a redesign of the biasing circuitry
reduces the temperature drift of input current. Improved specifications include:
- Offset voltage 3 mV maximum over temperature
- Input current 100 nA maximum over temperture
- Offset current 20 nA maximum over temperature
- Offsets guaranteed over entire common mode and supply voltage ranges
- Slew rate of 10V/uS as a summing amplifier
This amplifier offers many features which make its application nearly foolproof: overload
protection on the input and output, no latch-up when the common mode range is exceeded,
and freedom from oscillations and compensation with a single 30 pF capacitor. It has
advantages over internally compensated amplifiers in that the frequency compensation can
be tailored to the particular application. For example, in low frequency circuits it can
be overcompensated for increased stability margin. Or the compensation can be optimized to
give more than a factor of ten improvement in high frequency performance for most
applications.
In addition, the device provides better accuracy and lower noise in high impedance
circuitry. The low input currents also make it particularly well suited for long interval
integrators or timers, sample and hold circuits, and low frequency waveform generators.
Further, replacing circuits where matched transistor pairs buffer the inputs of
conventional IC op amps, it can give lower offset voltage and a drift at a lower cost.
Industry Part Number
LM101A
Prime Die
LM101F
NS Part Numbers
LM101AH/883
LM101AJ-14/883
LM101AJ/883
LM101AW/883
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
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Dynamic tests at
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Functional tests at
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Functional tests at
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Switching tests at
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Switching tests at
Temp ( ^oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
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