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ADC11DS105 Datasheet, PDF (1/24 Pages) National Semiconductor (TI) – Dual 11-Bit, 105 MSPS A/D Converter with Serial LVDS Outputs | |||
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ADC11DS105
November 4, 2009
Dual 11-Bit, 105 MSPS A/D Converter with Serial LVDS
Outputs
General Description
The ADC11DS105is a high-performance CMOS analog-to-
digital converters capable of converting two analog input
signals into 11-bit digital words at rates up to 105 Mega Sam-
ples Per Second (MSPS). The digital outputs are serialized
and provided on differential LVDS signal pairs. These con-
verters use a differential, pipelined architecture with digital
error correction and an on-chip sample-and-hold circuit to
minimize power consumption and the external component
count, while providing excellent dynamic performance. The
ADC11DS105 may be operated from a single +3.0 or +3.3V
power supply. A power-down feature reduces the power con-
sumption to very low levels while still allowing fast wake-up
time to full operation. The differential inputs accept a 2V full
scale differential input swing. A stable 1.2V internal voltage
reference is provided, or the ADC11DS105 can be operated
with an external 1.2V reference. The selectable duty cycle
stabilizer maintains performance over a wide range of clock
duty cycles. A serial interface allows access to the internal
registers for full control of the ADC11DS105's functionality.
The ADC11DS105 is available in a 60-lead LLP package and
operates over the industrial temperature range of â40°C to
+85°C.
Features
â Clock Duty Cycle Stabilizer
â Single +3.0 or +3.3V supply operation
â Serial LVDS Outputs
â Serial Control Inteface
â Overrange Outputs
â 60-pin LLP package, (9x9x0.8mm, 0.5mm pin-pitch)
Key Specifications
â Resolution
â Conversion Rate
â SNR (fIN = 240 MHz)
â SFDR (fIN = 240 MHz)
â Full Power Bandwidth
â Power Consumption
11 Bits
105 MSPS
66 dBFS (typ)
82 dBFS (typ)
1 GHz (typ)
1 W (typ)
Applications
â High IF Sampling Receivers
â Wireless Base Station Receivers
â Test and Measurement Equipment
â Communications Instrumentation
â Portable Instrumentation
Connection Diagram
© 2009 National Semiconductor Corporation 300293
30029301
www.national.com
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