SM5024 Datasheet, PDF (5/9 Pages) Nippon Precision Circuits Inc – Miniature-package Crystal Oscillator Module ICs

SM5024 series
Electrical Characteristics
3V operation
V_SS = 0V, recommended operating conditions unless otherwise noted.
Parameter
Symbol
Condition
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Current consumption
INHN pull-up resistance
Feedback resistance
Built-in capacitance
V_OH Q: Measurement cct 1, V_DD = 2.7V, I_OH = 8mA
V_OL Q: Measurement cct 2, V_DD = 2.7V, I_OL = 8mA
V_IH INHN
V_IL INHN
I_Z
Q: Measurement cct 2, INHN = LOW,
V_DD = 3.6V
V_OH = V_DD
V_OL = V_SS
SM5024AL1H
I _DD1
Measurement cct 3, load cct 1,
INHN = open, C_L = 15pF, f = 30MHz
SM5024AL2H
SM5024AL3H
SM5024AL4H
R_UP Measurement cct 4
R_f Measurement cct 5
C_G
Design value. A monitor pattern on a wafer is tested.
C_D
5V operation
V_SS = 0V, recommended operating conditions unless otherwise noted.
Parameter
Symbol
Condition
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Current consumption
INHN pull-up resistance
Feedback resistance
Built-in capacitance
V_OH Q: Measurement cct 1, V_DD = 4.5V, I_OH = 16mA
V_OL Q: Measurement cct 2, V_DD = 4.5V, I_OL = 16mA
V_IH INHN
V_IL INHN
I_Z
Q: Measurement cct 2, INHN = LOW,
V_DD = 5.5V
V_OH = V_DD
V_OL = V_SS
SM5024AL1H
I _DD2
Measurement cct 3, load cct 1,
INHN = open, C_L = 50pF, f = 30MHz
SM5024AL2H
SM5024AL3H
SM5024AL4H
R_UP Measurement cct 4
R_f Measurement cct 5
C_G
Design value. A monitor pattern on a wafer is tested.
C_D
Rating
Unit
min
typ
max
2.1
2.4
–
V
–
0.3
0.5
V
2.0
–
–
V
–
–
0.5
V
–
–
10
µA
–
–
10
µA
–
4
8
mA
–
2.5
5
mA
–
2
4
mA
–
1.5
3
mA
25
100
250
kΩ
200
600
1000
kΩ
7.44
8
8.56
pF
9.3
10
10.7
pF
Rating
Unit
min
typ
max
3.9
4.2
–
V
–
0.3
0.5
V
2.0
–
–
V
–
–
0.8
V
–
–
10
µA
–
–
10
µA
–
13
26
mA
–
7
14
mA
–
4
8
mA
–
3
6
mA
25
100
250
kΩ
200
600
1000
kΩ
7.44
8
8.56
pF
9.3
10
10.7
pF
NIPPON PRECISION CIRCUITS INC.—5