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PXIE-5450 Datasheet, PDF (1/6 Pages) National Instruments Corporation – Dual-channel, differential I/Q signal generation
400 MS/s, 16-Bit I/Q Signal Generator
NI PXIe-5450 NEW!
• Dual-channel, differential I/Q
signal generation
• 16-bit resolution, 400 MS/s
sampling rate per channel
• 98 dB close-in SFDR at 1 MHz
• 145 MHz analog bandwidth for
generating 290 MHz bandwidth RF signals
• ±0.15 dB flatness to 120 MHz with
digital flatness correction
• 25 ps channel-to-channel skew
• <-140 dBc/Hz phase noise density for
10 MHz tone (1 kHz offset)
• -160 dBm/Hz average noise density
• 128 or 512 MB of deep
onboard memory
• Continuous data streaming
>600 MB/s from host
• 1 Vpk-pk output, 2 PXI slots
Operating Systems
• Windows Vista/XP/2000
Recommended Software
• LabVIEW
• LabWindows™/CVI
• LabVIEW SignalExpress
• Measurement Studio
Included Software
• NI-FGEN driver
• NI-FGEN Express VIs
• NI Modulation Toolkit
• NI Analog Waveform Editor
• FGEN Soft Front Panel
• LabVIEW Real-Time driver
Calibration
• Self-calibration with gain and channel
alignment; offset correction
• 1-year external calibration cycle
Overview
The NI PXIe-5450 is a 16-bit, 400 MS/s, dual-channel arbitrary waveform
generator optimized for I/Q communications signals. Each of the differential
outputs features 98 dB of close-in spurious-free dynamic range (SFDR) at
1 MHz (without harmonics), better than -140 dBc/Hz phase noise density
at 10 MHz (1 kHz offset), and less than 25 ps channel-to-channel skew.
The NI PXIe-5450 is the ideal instrument to test devices with I/Q inputs
or to serve as the baseband component of an RF vector signal generator.
It also features onboard signal processing (OSP) functions that include
pulse shaping and interpolation filters, gain and offset control, and a
numerically controlled oscillator (NCO) for frequency shifting. Common
applications include prototyping, validating, and testing of semiconductor
components and communications, radar, and electronic warfare systems.
With its NI Synchronization and Memory Core (SMC) architecture, the
NI PXIe-5450 helps you integrate mixed-signal test systems by enabling
synchronization with other instruments such as vector signal analyzers/
generators, high-speed digitizers, digital waveform analyzers/generators,
and other signal generators. You can also synchronize multiple arbitrary
waveform generators to form a phase-coherent multichannel generator
for applications such as MIMO (multiple-input, multiple-output) or
beamforming antenna schemes.
Signal Quality
With 16 bits of resolution, the NI PXIe-5450 achieves a close-in SFDR
(without harmonics) of 98 dB at 1 MHz. Including harmonics and
measured from DC to 200 MHz, it achieves a 1 MHz SFDR of 75 dB and
a wideband SFDR of 70 dB at 60 MHz. This ensures the dynamic range
and out-of-band performance needed to meet the stringent demands of
baseband I/Q signal generation (Figure 1).
Figure 1. With its high sample rate and resolution, the NI PXIe-5450 generates
low-distortion, high-SFDR signals over a very high bandwidth (the noise floor is
limited by the measurement device).