N-30EPU06 Datasheet, PDF (2/6 Pages) Nell Semiconductor Co., Ltd – FRED Ultrafast Soft Recovery Diode, 30 A

SEMICONDUCTOR
N-30EPU06 Series RRooHHSS
Nell High Power Products
DYNAMIC RECOVERY CHARACTERISTICS
(T_J = 25 ºC unless otherwise specified)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
I_F = 0.5A, I_R = 1A, I_RR=0.25A (RG#1 CKT)
-
30
35
I_F = 1A, dI_F/dt = -100 A/µs, V_R=30V, T_J =25°C
-
23
-
Reverse recovery time
t_rr
T_J = 25°C
-
30
-
Peak recovery current
Reverse recovery charge
l_RRM
Q_rr
T_J = 125°C
T_J = 25°C
T_J = 125°C
T_J = 25°C
T_J = 125°C
-
75
-
I_F = 30 A
-
3
-
dI_F/dt = -200 A/µs
V_R = 400 V
-
6
-
-
55
-
-
485
-
UNITS
ns
A
nC
THERMAL - MECHANICAL SPECIFICATIONS
PARAMETER
SYMBOL
TEST CONDITIONS
Thermal resistance,
junction to case
R_thJC
Thermal resistance,
case to heatsink
Mounting surface, flat, smooth
R_{thCS and greased}
Weight
Mounting torque
Marking device
Case style TO-247AC modified
Case style TO-247AC
MIN.
-
-
-
-
0.6
(5)
TYP.
MAX.
0.5
0.8
0.4
-
5.5
-
0.2
-
-
1.2
(10)
30EPU06
30APU06
UNITS
°C/W
g
oz.
N⋅ m
(lbf . in)
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