UPD75P036 Datasheet, PDF (1/52 Pages) NEC – 4-BIT SINGLE-CHIP MICROCONTROLLER

DATA SHEET
MOS Integrated Circuit
µPD75P036
4-BIT SINGLE-CHIP MICROCONTROLLER
DESCRIPTION
The µPD75P036 is a 4-bit signgle-chip microcontroller that replaced the µPD75028's on-chip ROM with
one-time PROM or EPROM. Because this device can operate at the same supply voltage as its mask
version, it is suited for preproduction in development stage or small-scale production.
The one-time PROM version is programmable only once and is useful for small-scale production of many
different products and time-to-market of a new product. The EPROM version is programmable, erasable,
and reprogrammable, and is suited for the evaluation of application systems.
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Detailed functions are described in the followig user's manual. Be sure to read it for designing.
µPD75028 User's Manual: IEU-1280
FEATURES
• µPD75028 compatible
• At full production, the µPD75P036 can be replaced with the µPD75028 which incorporates mask ROM
• Memory capacity
• Program memory (PROM): 16256 x 8 bits
• Data memory (RAM): 1024 x 4 bits
• Internal pull-up resistors can be specified by software: Ports 0-3, 6-8
• Internal pull-down resistors can be specified by software: Port 9
• Open-drain input/output: Ports 4, 5, 10
• Can operate at low voltage: VDD = 2.7 to 6.0 V
ORDERING INFORMATION
Part Number
Package
Internal ROM
Quality Grade
µPD75P036CW
64-pin plastic shrink DIP (750 mils)
One-time PROM
Standard
µPD75P036GC-AB8 64-pin plastic QFP (14 x 14 mm)
One-time PROM
Standard
µPD75P036KG
64-pin ceramic WQFN
EPROM
Not applicable
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Caution Internal pull-up/pull-down resistors cannot be specified by mask option as for this device.
Please refer to "Quality grade on NEC Semiconductor Devices" (Document number IEI-1209) published by NEC Corporation
to know the specification of quality grade on e devices and its recommended applications.
The reliability of the EPROM version, µPD75P036KG, is not guaranteed when used in mass-produced application
sets. Please use this device only experimentally or for evaluation during trial manufacture.
The function common to the one-time PROM and EPROM versions is referred to as PROM throughout this document.
The information in this document is subject to change without notice.
Document No. U10051EJ3V0DS00 (3rd edition)
(Previous No. IC-2967
Date Published September 1995 P
Printed in Japan
The mark 5 shows revised points.
© NEC Corporation 1991