GRM0222C1H4R5WA03 Datasheet, PDF (4/30 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitor

No
Item
Specification
15 High
Temperature
High Humidity
(Steady)
Appearance No defects or abnormalities.
Capacitance Within +/-7.5% or +/-0.75pF
Change
(Whichever is larger)
Q or D.F.
30pF and over:Q≧200
30pF and below
:Q≧100+10C/3
C:Nominal Capacitance(pF)
I.R.
More than 500MΩ or 25Ω·F (Whichever is smaller)
16 Durability
Appearance No defects or abnormalities.
Capacitance Within +/-3% or +/-0.3pF
Change
(Whichever is larger)
Q or D.F.
30pF and over:Q≧350
10pF and over
30pF and below　 : Q≧275+5C/2
10pF and below　 : Q≧200+10C
C:Nominal Capacitance (pF)
I.R.
More than 1,000MΩ or 50Ω·F (Whichever is smaller)
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature
: 40+/-2℃
Test Humidity
: 90%RH to 95%RH
Test Time
: 500+/-12h
Applied Voltage
: DC Rated Voltage
Charge/discharge current : 50mA max.
Exposure Time
: 24+/-2h
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature
: Max. Operating Temp. +/-3℃
Test Time
: 1000+/-12h
Applied Voltage
: 200% of the rated voltage
Charge/discharge current : 50mA max.
Exposure Time
: 24+/-2h
Table A
Char.
2C
3C
4C
5C
Capacitance Change from 20C (%) (5C only : 25C)
-55℃
-30℃
-25℃
-10℃
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Min.
0.82
-0.45
-
-
0.49
-0.27
0.33
-0.18
1.37
-0.90
-
-
0.82
-0.54
0.55
-0.36
2.56
-1.88
-
-
1.54
-1.13
1.02
-0.75
0.58
-0.24
0.40
-0.17
-
-
0.25
-0.11
JEMCGS-04590A
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