GRM1555C1H100JA01D Datasheet, PDF (3/29 Pages) Murata Manufacturing Co., Ltd. – CHIP MONOLITHIC CERAMIC CAPACITOR FOR GENERAL GRM1555C1H100JA01_ (0402, C0G, 10pF, 50Vdc)

■SPECIFICATIONS AND TEST METHODS
No
Item
11 Vibration
Resistance
Appearance
Capacitance
Specification
Temperature
High Dielectric
Compensating Type Constant Type
No defects or abnormalities.
Within the specified tolerance.
12 Deflection
Q/D.F.
30pF and over:Q≧1000
ï¼»R6,R7,C8,L8ï¼½
30pF and beloow:Q≧400+20C W.V.:100V :0.025max.(C＜0.068mF)
:0.05max.(C≧0.068mF)
C:Nominal Capacitance(pF) W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C＜3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25V: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C＜0.1mF)
:0.09max. (C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
Appearance No defects or abnormalities.
Capacitance Within ±5% or± 0.5pF
Change
(Whichever is larger)
Within ±10%
13 Solderability
of Termination
75% of the terminations is to be soldered evenly and continuously.
14 Resistance to
Soldering Heat
The measured and observed characteristics should satisfy
the specifications in the following table.
Appearance
Capacitance
Change
Q/D.F.
I.R.
No defects or abnormalities.
Within ±2.5% or± 0.25pF
(Whichever is larger)
30pF and over:Q≧1000
R6,R7,R9,C8,L8:Within ±7.5%
E4,F5 :Within ±20%
ï¼»R6,R7,C8,L8ï¼½
30pF and beloow:Q≧400+20C W.V.:100V :0.025max.(C＜0.068mF)
:0.05max.(C≧0.068mF)
C:Nominal Capacitance(pF) W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C＜3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25V: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C＜0.1mF)
:0.09max. (C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
More than 10,000MW or 500W·F(Whichever is smaller)
Test Method
Solder the capacitor on the test jig (glass epoxy board) in the same
manner and under the same conditions as (10).
The capacitor should be subjected to a simple harmonic motion
having a total amplitude of 1.5mm, the frequency being varied
uniformly between the approximate limits of 10 and 55Hz. The
frequency range, from 10 to 55Hz and return to 10Hz, should be
traversed in approximately 1 minute. This motion should be
applied for a period of 2 hours in each 3 mutually perpendicular
directions(total of 6 hours).
Solder the capacitor on the test jig (glass epoxy board) shown in
Fig.1 using an eutectic solder. Then apply a force in the direction
shown in Fig 2 for 5±1 seconds. The soldering should be done
by the reflow method and should be conducted with care so that
the soldering is uniform and free of defects such as heat shock.
Immerse the capacitor in a solution of ethanol (JIS-K-8101) and
rosin (JIS-K-5902) (25% rosin in weight propotion) .
Preheat at 80 to 120℃ for 10 to 30 seconds.
After preheating , immerse in an eutectic solder solution for
2±0.5 seconds at 230±5℃ or Sn-3.0Ag-0.5Cu solder solution
for 2±0.5 seconds at 245±5℃.
Preheat the capacitor at *120 to 150℃ for 1 minute.
Immerse the capacitor in an eutectic solder solution^* or
Sn-3.0Ag-0.5Cu solder solution at 270±5℃ for 10±0.5 seconds.
Set at room temperature for 24±2 hours, then measure.
*Not apply to GRM02
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10C for one hour and then set
at room temperature for 24±2 hours.
Perform the initial measurement.
*Preheating for GRM32/43/55
Step
Temperature
1
100C to 120C
2
170C to 200C
Time
1 min.
1 min.
Dielectric
Strength
15 Temperature Cycle
No defects.
The measured and observed characteristics should satisfy
the specifications in the following table.
Appearance No defects or abnormalities.
Capacitance
Change
Q/D.F.
I.R.
Within ±2.5% or± 0.25pF
R6,R7,R9,C8,L8:Within ±7.5%
(Whichever is larger)
E4,F5 :Within ±20%
30pF and over:Q≧1000
ï¼»R6,R7,C8,L8ï¼½
30pF and beloow:Q≧400+20C W.V.:100V :0.025max.(C＜0.068mF)
:0.05max.(C≧0.068mF)
C:Nominal Capacitance(pF) W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C＜3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25V: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C＜0.1mF)
:0.09max. (C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
More than 10,000MW or 500W·F(Whichever is smaller)
Fix the capacitor to the supporting jig in the same
manner and under the same conditions as (10).
Perform the five cycles according to the four heat
treatments shown in the following table.
Set for 24±2 hours at room temperature, then measure.
Step
1
2
3
4
Temp.(C)
Min.
Operating Temp.+0/-3
Room Temp
Max.
Operating Temp.+3/-0
Room Temp
Time (min)
30±3
2 to 3
30±3
2 to 3
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10C for one hour and then set
at room temperature for 24±2 hours.
Perform the initial measurement.
Dielectric
Strength
No defects.
JEMCGS-0015Q
3