GRM0222C1H4R8WA03 Datasheet, PDF (3/30 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitor

No
Item
Specification
10 Vibration
Appearance
Capacitance
Q or D.F.
No defects or abnormalities.
Within the specified initial value.
Within the specified initial value.
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
Solder the capacitor on the test substrate shown in Fig.3.
Kind of Vibration
: A simple harmonic motion
10Hz to 55Hz to 10Hz (1min)
Total amplitude
: 1.5mm
This motion should be applied for a period of 2h in each 3 mutually
perpendicular directions(total of 6h).
11 Substrate
Bending test
Appearance
Capacitance
Change
No defects or abnormalities.
Within +/-5% or +/-0.5pF
(Whichever is larger)
Solder the capacitor on the test substrate shown in Fig.1.
Pressurization method : Shown in Fig.2
Flexure　
　　　: 1mm
Holding Time
: 5+/-1s
Soldering Method
: Reflow soldering
12 Solderability
95% of the terminations is to be soldered evenly and continuously.
Test Method
Flux
Preheat
Solder
Solder Temp.
Immersion time
: Solder bath method
Solution of rojin ethanol 25(wt)%
: 80℃ to 120℃ for 10s to 30s
: Sn-3.0Ag-0.5Cu
: 245+/-5℃
: 2+/-0.5s
13 Resistance to
Soldering Heat
Appearance
Capacitance
Change
No defects or abnormalities.
Within +/-2.5% or +/- 0.25pF
(Whichever is larger)
Q or D.F.
Within the specified initial value.
I.R.
Within the specified initial value.
Voltage proof No defects.
<GRM03 size min.>
Test Method
Solder
Solder Temp.
Immersion time
Exposure Time
Preheat
　
: Solder bath method
: Sn-3.0Ag-0.5Cu
: 270+/-5℃
: 10+/-0.5s
: 24+/-2h
: GRM31 size max.: 120℃ to 150℃ for 1 min
GRM32 size 　　 : 100℃ to 120℃ for 1 min
and 170℃ to 200℃ for 1 min
<GRM02 size only>
Test Method
Solder
Solder Temp.
Reflow Time
Test Substrate
Exposure Time
Preheat
: Reflow soldering (hot plate)
: Sn-3.0Ag-0.5Cu
: 270+/-5℃
: 10+/-0.5s
: Glass epoxy PCB
: 24+/-2h
: 120℃ to 150℃ for 1 min
14 Temperature Appearance
Sudden Change Capacitance
Change
No defects or abnormalities.
Within +/-2.5% or+/- 0.25pF
(Whichever is larger)
Q or D.F.
Within the specified initial value.
I.R.
Within the specified initial value.
Voltage proof No defects.
Solder the capacitor on the test substrate shown in Fig.3.
Perform the five cycles according to the four heat treatments
shown in the following table.
Step
Temp.(C)
1 Min.Operating Temp.+0/-3
2
Room Temp.
3 Max.Operating Temp.+3/-0
4
Room Temp
Time (min)
30+/-3
2 to 3
30+/-3
2 to 3
Exposure Time
: 24+/-2h
JEMCGS-04590A
3