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GRM0222C1H4R3BA03 Datasheet, PDF (3/30 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitor | |||
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No
Item
Specification
10 Vibration
Appearance
Capacitance
Q or D.F.
No defects or abnormalities.
Within the specified initial value.
Within the specified initial value.
Test Method
(Ref. Standard:JIS C 5101, IEC60384ï¼
Solder the capacitor on the test substrate shown in Fig.3.
Kind of Vibration
: A simple harmonic motion
10Hz to 55Hz to 10Hz (1min)
Total amplitude
: 1.5mm
This motion should be applied for a period of 2h in each 3 mutually
perpendicular directions(total of 6h).
11 Substrate
Bending test
Appearance
Capacitance
Change
No defects or abnormalities.
Within +/-5% or +/-0.5pF
(Whichever is larger)
Solder the capacitor on the test substrate shown in Fig.1.
Pressurization method : Shown in Fig.2
Flexureã
ããã: 1mm
Holding Time
: 5+/-1s
Soldering Method
: Reflow soldering
12 Solderability
95% of the terminations is to be soldered evenly and continuously.
Test Method
Flux
Preheat
Solder
Solder Temp.
Immersion time
: Solder bath method
Solution of rojin ethanol 25(wt)%
: 80â to 120â for 10s to 30s
: Sn-3.0Ag-0.5Cu
: 245+/-5â
: 2+/-0.5s
13 Resistance to
Soldering Heat
Appearance
Capacitance
Change
No defects or abnormalities.
Within +/-2.5% or +/- 0.25pF
(Whichever is larger)
Q or D.F.
Within the specified initial value.
I.R.
Within the specified initial value.
Voltage proof No defects.
<GRM03 size min.>
Test Method
Solder
Solder Temp.
Immersion time
Exposure Time
Preheat
ã
: Solder bath method
: Sn-3.0Ag-0.5Cu
: 270+/-5â
: 10+/-0.5s
: 24+/-2h
: GRM31 size max.: 120â to 150â for 1 min
GRM32 size ãã : 100â to 120â for 1 min
and 170â to 200â for 1 min
<GRM02 size only>
Test Method
Solder
Solder Temp.
Reflow Time
Test Substrate
Exposure Time
Preheat
: Reflow soldering (hot plate)
: Sn-3.0Ag-0.5Cu
: 270+/-5â
: 10+/-0.5s
: Glass epoxy PCB
: 24+/-2h
: 120â to 150â for 1 min
14 Temperature Appearance
Sudden Change Capacitance
Change
No defects or abnormalities.
Within +/-2.5% or+/- 0.25pF
(Whichever is larger)
Q or D.F.
Within the specified initial value.
I.R.
Within the specified initial value.
Voltage proof No defects.
Solder the capacitor on the test substrate shown in Fig.3.
Perform the five cycles according to the four heat treatments
shown in the following table.
Step
Temp.(ï°C)
1 Min.Operating Temp.+0/-3
2
Room Temp.
3 Max.Operating Temp.+3/-0
4
Room Temp
Time (min)
30+/-3
2 to 3
30+/-3
2 to 3
Exposure Time
: 24+/-2h
JEMCGS-04590A
3
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