GA342QR7GF471KW01L Datasheet, PDF (12/13 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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GSaAf3etSyeSrtiaensdSaprdecCifeicrtaiftieodnsTyapnedGTCes/Gt DM/eGthFo/GdBs Specifications and Test Methods
Continued from the preceding page.
No.
Item
Specifications
Appearance No marking defects
Capacitance
Change
Char.
X7R
SL
Capacitance Change
Within T15%
Within T2.5% or T0.25pF
(Whichever is larger)
D.F.
Q
16
Temperature
Cycle
I.R.
Char.
X7R
SL
Specification
D.F.V0.05
QU400W20C*² (CF30pF)
QU1000
(CU30pF)
More than 3,000MΩ
Test Method
Fix the capacitor to the supporting jig (glass epoxy board) shown
in Fig. 4.
Perform the 5 cycles according to the 4 heat treatments listed in
the following table.
Let sit for 24T2 hrs. at room condition,*¹ then measure.
Step
1
2
3
4
Temperature (D)
Min. Operating Temp.T3
Room Temp.
Max. Operating Temp.T2
Room Temp.
Time (min.)
30T3
2 to 3
30T3
2 to 3
#Pretreatment for X7R char.
Perform a heat treatment at 150^W Y10 0 D for 60T5 min. and then
let sit for 24T2 hrs. at room condition.*¹
Dielectric
Strength
In accordance with item No.4
Appearance No marking defects
Glass Epoxy Board
Fig. 4
Solder resist
Cu
Capacitance
Change
Humidity
17 (Steady
State) ^D.F.
Q
Char.
X7R
SL
Capacitance Change
Within T15%
Within T5.0% or T0.5pF
(Whichever is larger)
Char.
X7R
SL
Specification
D.F.V0.05
QU275W5/2C*² (CF30pF)
QU350
(CU30pF)
I.R.
Dielectric
Strength
More than 3,000MΩ
In accordance with item No.4
Before this test, the test shown in the following is performed.
·Item 11 Adhesive Strength of Termination (applied force is 5N)
·Item 13 Deflection
Let the capacitor sit at 40T2D and relative humidity of 90 to 95%
for 500Y ^{W20 4} hrs.
Remove and let sit for 24T2 hrs. at room condition,*¹ then
measure.
#Pretreatment for X7R char.
Perform a heat treatment at 150^W Y10 0D for 60T5 min. and then
let sit for 24T2 hrs. at room condition.*¹
18 Life
Appearance No marking defects
Capacitance
Change
Char.
X7R
SL
Capacitance Change
Within T20%
Within T3.0% or T0.3pF
(Whichever is larger)
Char.
Specification
D.F.
X7R
D.F.V0.05
Q
SL
QU275W5/2C*² (CF30pF)
QU350
(CU30pF)
I.R.
More than 3,000MΩ
Before this test, the test shown in the following is performed.
·Item 11 Adhesive Strength of Termination (apply force is 5N)
·Item 13 Deflection
Impulse Voltage
Each individual capacitor should
be subjected to a 2.5kV (Type
GC/GF: 5kV) Impulse (the
voltage value means zero to
peak) for three times. Then the
capacitors are applied to life test.
Front time (T1)=1.2µs=1.67T
Time to half-value (T2)=50µs
(%)
100
90
50
30
0
t
T
T1
T2
Apply voltage as in Table for 1,000 hrs. at 125^W Y²⁰D, relative
humidity 50% max.
Dielectric
Strength
In accordance with item No.4
Type
Applied Voltage
GB
AC312.5V (r.m.s.), except that once each hour the
voltage is increased to AC1,000V (r.m.s.) for 0.1 sec.
GC
GF
GD
AC425V (r.m.s.), except that once each hour the
voltage is increased to AC1,000V (r.m.s.) for 0.1 sec.
Let sit for 24T2 hrs. at room condition,*¹ then measure.
#Pretreatment for X7R char.
Perform a heat treatment at 150Y ^W100D for 60T5 min. and then
let sit for 24T2 hrs. at room condition.*¹
*1 "Room condition" Temperature: 15 to 35D, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
*2 "C" expresses nominal capacitance value (pF).
Continued on the following page.
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