RP1236-1_15 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 312.0 MHz SAW Resonator

• Designed for 312 MHz Low-Power Superhet Transmitters
• Nominal Insertion Phase Shift of 180° at Resonance
• Quartz Stability
• Rugged, Hermetic, Low-Profile TO39 Case
The RP1236-1 is a two-port, 180° surface-acoustic-wave (SAW) resonator in a low-profile TO39
case. It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency
transmitters operating at 312 MHz. Typical applications include wireless security and remote-
control receivers operating in the USA under FCC Part 15 and in Canada under DoC RSS-210.
RFM products are now
Murata products.
RP1236-1
312.0 MHz
SAW Resonator
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Any Two Pins (Observe ESD Precautions)
Case Temperature
Value
+0
±30
-40 to +85
Units
dBm
VDC
°C
TO39-3 Case
Characteristic
Center Frequency
Absolute Frequency
Tolerance from 312.000 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability Turnover Temperature
Turnover Frequency
Frequency Temp. Coefficient
Frequency Aging
Absolute Value during First Year
DC Insulation Resistance between Any Two Pins
RF Equivalent RLC
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Lid Symbolization (in addition to Lot and/or Date Codes)
Sym
f_C
Δf_C
IL
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
Notes
2, 3, 4, 5,
Minimum
311.750
Typical
2, 5, 6
5, 6, 7
6, 7, 8
6
5
5, 7, 9
5, 6, 9
8.1
14,000
8,500
24
39
f_C+2.3
0.037
≤ 10
1.0
154
1.09824
0.236938
1.3
1.6
RFM P1236
Maximum
312.250
±250
13.0
54
347
1.9
Units
MHz
kHz
dB
°C
kHz
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Frequency aging is the change in f_C with time and is specified at +65°C or less. Aging may exceed the specification for prolonged temperatures above +65°C. Typically,
aging is greatest the first year after manufacture, decreasing significantly in subsequent years.
2. The frequency f_C is the frequency of minimum IL with the resonator in the specified test fixture in a 50 Ω test system with VSWR ≤ 1.2:1. Typically, f_OSCILLATOR or
f_TRANSMITTER is less than the resonator f_C.
3. One or more of the following United States patents apply: 4,454,488; 4,616,197.
4. Typically, equipment utilizing this device requires emissions testing and government approval, which is the responsibility of the equipment manufacturer.
5. Unless noted otherwise, case temperature T_C = +25°C± 5°C
6. The design, manufacturing process, and specifications of this device are subject to change without notice.
7. Derived mathematically from one or more of the following directly measured parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
8. Turnover temperature, T_O, is the temperature of maximum (or turnover) frequency, f_O. The nominal frequency at any case temperature, T_C, may be calculated from: f =
f_O [1 - FTC (T_O - T_C)²]. Typically, oscillator T_O is 20° less than the specified resonator T_O.
9. This equivalent RLC model approximates resonator performance near the resonant frequency and is provided for reference only. The capacitance C_O is the measured
static (nonmotional) capacitance between either pin 1 and ground or pin 2 and ground. The measurement includes case parasitic capacitance.
©2010-2015 by Murata Electronics N.A., Inc.
RP1236-1 (R) 2/11/15
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