RO3188A Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 390.0 MHz SAW Resonator

• Ideal for European 390.0 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS) Pb
The RO3188A is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount, ceramic case.
It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency transmitters operat-
ing at 390.0 MHz.
RO3188A
390.0 MHz
SAW
Resonator
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See: Typical Test Circuit)
DC voltage Between Terminals (Observe ESD Precautions)
Case Temperature
Soldering Temperature (10 seconds / 5 cycles maximum)
Value
+0
±30
-40 to +85
260
Units
dBm
VDC
°C
°C
SM5035-4
Electrical Characteristics
Characteristic
Sym
Notes
Minimum
Typical
Center Frequency (+25 °C)
Insertion Loss
Absolute Frequency
Tolerance from 390.0 MHz
f_C
2,3,4,5
389.900
∆f_C
IL
2,5,6
1.3
Quality Factor
Temperature Stability
Unloaded Q
50 Ω Loaded Q
Q_U
5,6,7
Q_L
Turnover Temperature
Turnover Frequency
T_O
10
f_O
6,7,8
Frequency Temperature Coefficient FTC
12647
1532
25
f_C
0.032
Frequency Aging
Absolute Value during the First Year
|f_A|
1
≤10
DC Insulation Resistance between Any Two Terminals
5
1.0
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
R_M
L_M
C_M
C_O
L_TEST
5, 7, 9
5, 6, 9
2, 7
13.8
71.2
2.3
3.0
55
797 // YWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
Maximum
390.100
±100
2.0
Units
MHz
kHz
dB
40
°C
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
1. Frequency aging is the change in f_C with time and is specified at +65 °C or less. 8. Turnover temperature, T_O, is the temperature of maximum (or turnover) fre-
Aging may exceed the specification for prolonged temperatures above +65 °C.
quency, f_O. The nominal frequency at any case temperature, T_C, may be calcu-
2.
Typically, aging is greatest the first year after manufacture, decreasing in subse-
quent years.
The center frequency, f_C, is measured at the minimum insertion loss point,
IL_MIN, with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt
9.
inductance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically, f_OS-
lated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is approximately
equal to the specified resonator T_O.
This equivalent RLC model approximates resonator performance near the reso-
nant frequency and is provided for reference only. The capacitance C_O is the
static (nonmotional) capacitance between the two terminals measured at low
CILLATOR ^{or f}TRANSMITTER ^{is approximately equal to the resonator f}C^.
frequency (10 MHz) with a capacitance meter. The measurement includes para-
3. One or more of the following United States patents apply: 4,454,488 and
sitic capacitance with "NC” pads unconnected. Case parasitic capacitance is
4,616,197.
approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
4.
Typically, equipment utilizing this device requires emissions testing and govern-
ment approval, which is the responsibility of the equipment manufacturer.
C_P ≈ C_O - 0.05 pF.
10. Tape and Reel standard per ANSI / EIA 481.
5. Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
6. The design, manufacturing process, and specifications of this device are subject
to change without notice.
7. Derived mathematically from one or more of the following directly measured
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
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RO3188A - 6/24/11