RO3164D-3 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 868.35 MHz SAW Resonator

• Ideal for 868.35 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Complies with Directive 2002/95/EC (RoHS)
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The RO3164D-3 is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount ceramic
case. It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency transmitters
operating at 868.35 MHz.
Absolute Maximum Ratings
Input Power Level
DC Voltage
Rating
Case Temperature
Soldering Temperature (10 seconds / 5 cycles maximum)
Value
0
12
-40 to +85
260
Units
dBm
VDC
°C
°C
RO3164D-3
868.35 MHz
SAW
Resonator
SM3838-6 Case
3.8 X 3.8
Electrical Characteristics
Characteristic
Center Frequency, +25°C ±2°C
Center Frequence Tolerance from 868.350 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Standard Reel Quantity
Reel Size 7 Inch
Reel Size 13 Inch
Sym
f_C
∆f_C
IL
Q_U
Q_L
T_O
f_O
FTC
|fA|
R_M
L_M
C_M
C_O
L_TEST
Notes
2,3,4,5
2,5,6
5,6,7
6,7,8
1
5
5, 6, 7, 9
5, 6, 9
2, 7
Minimum
868.275
Typical
1.1
24000
4000
10
25
f_C
0.032
<±10
1.0
18.0
12.0
2.1
2.0
19.4
845 / YWWS
500 Pieces / Reel
3000 Pieces / Reel
Maximum
868.425
±75
2.0
40
Units
MHz
kHz
dB
°C
kHz
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Frequency aging is the change in f_C with time and is specified at +65°C or less.
to change without notice.
Aging may exceed the specification for prolonged temperatures above +65°C.
7. Derived mathematically from one or more of the following directly measured
Typically, aging is greatest the first year after manufacture, decreasing in subse-
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
quent years.
8. Turnover temperature, T_O, is the temperature of maximum (or turnover) fre-
2. The center frequency, f_C, is measured at the minimum insertion loss point, IL_MIN,
quency, f_O. The nominal frequency at any case temperature, T_C, may be calcu-
with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt induc-
tance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically, f_OSCILLA-
TOR ^{or f}TRANSMITTER ^{is approximately equal to the resonator f}C^.
lated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is approximately
equal to the specified resonator T_O.
9. This equivalent RLC model approximates resonator performance near the reso-
3. One or more of the following United States patents apply: 4,454,488 and
4,616,197.
4. Typically, equipment utilizing this device requires emissions testing and govern-
ment approval, which is the responsibility of the equipment manufacturer.
5. Unless noted otherwise, case temperature T_C = +25°C±2°C.
nant frequency and is provided for reference only. The capacitance C_O is the
static (nonmotional) capacitance between the two terminals measured at low fre-
quency (10 MHz) with a capacitance meter. The measurement includes parasitic
capacitance with "NC” pads unconnected. Case parasitic capacitance is
approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
6. The design, manufacturing process, and specifications of this device are subject
C_P ≈ C_O - 0.05 pF.
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RO3164D-3(R) - 4/29/09