RO3164A-3-15 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 868.35 MHz SAW Resonator

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RO3164A-3
• Ideal for European 868.35 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS)
The RO3164A-3 is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount ceramic
case. It provides reliable, fundamental-mode quartz frequency stabilization of fixed-frequency transmitters
operating at 868.35 MHz.
Absolute Maximum Ratings
Rating
Value
Units
CW RF Power Dissipation
+5
dBm
DC Voltage Between Terminals
±30
VDC
Case Temperature
-40 to +85
°C
Soldering Temperature (10 seconds / 5 cycles maximum)
260
°C
868.35 MHz
SAW Resonator
SM5035-4
Electrical Characteristics
Characteristic
Frequency at 25 °C
RO3164A-3
Tolerance from 868.35 MHz RO3164A-3
Insertion Loss
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Sym
f_C
Δf_C
IL
Q_U
Q_L
T_O
f_O
FTC
|fA|
R_M
L_M
C_M
C_O
L_TEST
Notes
2,3,4,5
2,5,6
5,6,7
6,7,8
1
5
5, 6, 7, 9
5, 6, 9
2, 7
Minimum
868.275
Typical
1.3
6600
800
10
25
f_C
0.032
<±10
1.0
13.8
16.8
2.0
1.8
18.3
814 // YYWWS
Maximum
868.425
±75
2.0
40
Units
MHz
kHz
dB
°C
kHz
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1.
Frequency aging is the change in f_C with time and is specified at +65 °C or less.
Aging may exceed the specification for prolonged temperatures above +65 °C.
7.
Derived mathematically from one or more of the following directly measured
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
2.
3.
4.
5.
6.
Typically, aging is greatest the first year after manufacture, decreasing in subse-
quent years.
The center frequency, f_C, is measured at the minimum insertion loss point, IL_MIN,
with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt
inductance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically,
f_OSCILLATOR or f_TRANSMITTER is approximately equal to the resonator f_C.
One or more of the following United States patents apply: 4,454,488 and
4,616,197.
Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment manufacturer.
Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
The design, manufacturing process, and specifications of this device are subject
8.
9.
Turnover temperature, T_O, is the temperature of maximum (or turnover)
frequency, f_O. The nominal frequency at any case temperature, T_C, may be
calculated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is
approximately equal to the specified resonator T_O.
This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C_O is
the static (nonmotional) capacitance between the two terminals measured at low
frequency (10 MHz) with a capacitance meter. The measurement includes
parasitic capacitance with "NC” pads unconnected. Case parasitic capacitance
is approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
C_P ≈ C_O - 0.05 pF.
to change without notice.
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RO3164A-3 (R) 2/10/15
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