RO3156A-3 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 868.95 MHz SAW Resonator

• Ideal for European 868.95 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-Mount Ceramic Case with 21 mm² Footprint
• Complies with Directive 2002/95/EC (RoHS)
The RO3156A-3 is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount ceramic
case. It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency transmitters
operating at 868.95 MHz. This SAW is designed specifically for remote-control and wireless security trans-
mitters operating under ETSI-ETS 300 220 in Europe and under FTZ 17 TR 2100 in Germany.
Absolute Maximum Ratings
Rating
CW RF Power Dissipation
DC Voltage Between Terminals
Case Temperature
Soldering Temperature (10 seconds / 5 cycles max.)
Value
+5
±30
-40 to +85
260
Units
dBm
VDC
°C
°C
RO3156A-3
868.95 MHz
SAW
Resonator
SM5035-4
Electrical Characteristics
Characteristic
Frequency (+25 °C) Nominal Frequency
Tolerance from 868.95 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Sym
f_C
∆f_C
IL
Q_U
Q_L
T_O
f_O
FTC
|fA|
R_M
L_M
C_M
C_O
L_TEST
Notes
2,3,4,5
2,5,6
5,6,7
6,7,8
1
5
5, 6, 7, 9
5, 6, 9
2, 7
Minimum
868.875
Typical
1.2
7500
700
10
25
f_C
0.032
<±10
1.0
10.2
14.0
2.0
2.1
14.3
808 // YWWS
Maximum
869.025
±75
2.0
Units
MHz
kHz
dB
40
°C
kHz
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Frequency aging is the change in f_C with time and is specified at +65°C or less.
to change without notice.
Aging may exceed the specification for prolonged temperatures above +65°C. ^{7. Derived mathematically from one or more of the following directly measured}
Typically, aging is greatest the first year after manufacture, decreasing in subse-
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
quent years.
8. Turnover temperature, T_O, is the temperature of maximum (or turnover) fre-
2. The center frequency, f_C, is measured at the minimum insertion loss point, IL_MIN,
quency, f_O. The nominal frequency at any case temperature, T_C, may be calcu-
with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt induc-
tance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically, f_OSCILLA-
TOR ^{or f}TRANSMITTER ^{is approximately equal to the resonator f}C^.
lated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is approximately
equal to the specified resonator T_O.
9. This equivalent RLC model approximates resonator performance near the reso-
3. One or more of the following United States patents apply: 4,454,488 and
4,616,197.
4. Typically, equipment utilizing this device requires emissions testing and govern-
ment approval, which is the responsibility of the equipment manufacturer.
5. Unless noted otherwise, case temperature T_C = +25°C±2°C.
nant frequency and is provided for reference only. The capacitance C_O is the
static (nonmotional) capacitance between the two terminals measured at low fre-
quency (10 MHz) with a capacitance meter. The measurement includes parasitic
capacitance with "NC” pads unconnected. Case parasitic capacitance is
approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
6. The design, manufacturing process, and specifications of this device are subject
C_P ≈ C_O - 0.05 pF.
www.RFM.com E-mail: [e-mail]
©2008 by RF Monolithics, Inc.
Page 1 of 2
RO3156A-3 - 9/24/08