RO3135A_14 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 319.508 MHz SAW Resonator

RFM products are now
Murata products.
• Designed for 319.508 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
Pb
• Complies with Directive 2002/95/EC (RoHS)
The RO3135A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount
ceramic case. It provides reliable, fundamental-mode quartz frequency stabilization of fixed-frequency
transmitters operating at 319.508 MHz.
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
Soldering Temperature (10 seconds / 5 cycles maximum)
Value
+0
±30
-40 to +85
260
Units
dBm
VDC
°C
°C
RO3135A
319.508 MHz
SAW
Resonator
SM5035-4
Characteristic
Center Frequency, +25 °C
Tolerance from 319.508 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Sym
f_C
f_C
IL
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
L_TEST
Notes
2,3,4,5
2,5,6
5,6,7
6,7,8
1
5
5, 7, 9
5, 6, 9
2, 7
Minimum
Typical
319.508
1.5
19200
1500
10
25
f_C
0.032
10
1.0
8.4
81
3.06
3.5
70
839 // YYWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Maximum
±75
2.2
40
Units
MHz
kHz
dB
°C
ppm/°C²
ppm/yr
M

µH
fF
pF
nH
NOTES:
1. Frequency aging is the change in f_C with time and is specified at +65 °C or less.
Aging may exceed the specification for prolonged temperatures above +65 °C.
Typically, aging is greatest the first year after manufacture, decreasing in
subsequent years.
2. The center frequency, f_C, is measured at the minimum insertion loss point, IL_MIN,
with the resonator in the 50  test system (VSWR  1.2:1). The shunt
inductance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically,
f_OSCILLATOR or f_TRANSMITTER is approximately equal to the resonator f_C.
3. One or more of the following United States patents apply: 4,454,488 and
4,616,197.
4. Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment manufacturer.
5. Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
6. The design, manufacturing process, and specifications of this device are subject
to change without notice.
7. Derived mathematically from one or more of the following directly measured
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
8. Turnover temperature, T_O, is the temperature of maximum (or turnover)
frequency, f_O. The nominal frequency at any case temperature, T_C, may be
calculated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is
approximately equal to the specified resonator T_O.
9. This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C_O is
the static (nonmotional) capacitance between the two terminals measured at low
frequency (10 MHz) with a capacitance meter. The measurement includes
parasitic capacitance with "NC” pads unconnected. Case parasitic capacitance
is approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
C_P  C_O - 0.05 pF.
10. Tape and Reel standard per ANSI / EIA 481.
©2010-2014 by Murata Electronics N.A., Inc.
RO3135A (R) 4/22/14
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