RO3135A Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 319.508 MHz SAW Resonator

• Designed for 319.508 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS) _Pb
The RO3135A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount
ceramic case. It provides reliable, fundamental-mode quartz frequency stabilization of fixed-frequency
transmitters operating at 319.508 MHz.
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
Soldering Temperature (10 seconds / 5 cycles maximum)
Value
+0
±30
-40 to +85
260
Units
dBm
VDC
°C
°C
RO3135A
319.508 MHz
SAW
Resonator
SM5035-4
Electrical Characteristics
Characteristic
Center Frequency, +25 °C
Tolerance from 319.508 MHz
Insertion Loss
Sym
f_C
∆f_C
IL
Notes
2,3,4,5
2,5,6
Minimum
Typical
319.508
1.5
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
L_TEST
5,6,7
6,7,8
1
5
5, 7, 9
5, 6, 9
2, 7
19200
1500
10
25
f_C
0.032
≤10
1.0
8.4
81
3.06
3.5
70
839 // YWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
Maximum
±75
2.2
Units
MHz
kHz
dB
40
°C
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
1. Frequency aging is the change in f_C with time and is specified at +65 °C or less. 8. Turnover temperature, T_O, is the temperature of maximum (or turnover) fre-
Aging may exceed the specification for prolonged temperatures above +65 °C.
quency, f_O. The nominal frequency at any case temperature, T_C, may be calcu-
2.
Typically, aging is greatest the first year after manufacture, decreasing in subse-
quent years.
The center frequency, f_C, is measured at the minimum insertion loss point, IL_MIN,
with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt induc-
9.
tance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically, f_OSCILLA-
TOR ^{or f}TRANSMITTER ^{is approximately equal to the resonator f}C^.
lated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is approximately
equal to the specified resonator T_O.
This equivalent RLC model approximates resonator performance near the reso-
nant frequency and is provided for reference only. The capacitance C_O is the
static (nonmotional) capacitance between the two terminals measured at low fre-
quency (10 MHz) with a capacitance meter. The measurement includes parasitic
3. One or more of the following United States patents apply: 4,454,488 and
capacitance with "NC” pads unconnected. Case parasitic capacitance is
4,616,197.
approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
4.
5.
Typically, equipment utilizing this device requires emissions testing and govern-
ment approval, which is the responsibility of the equipment manufacturer.
Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
C_P ≈ C_O - 0.05 pF.
10. Tape and Reel standard per ANSI / EIA 481.
6. The design, manufacturing process, and specifications of this device are subject
to change without notice.
7. Derived mathematically from one or more of the following directly measured
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
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RO3135A(R) - 8/29/11