RO3134A Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 372.5 MHz SAW Resonator

• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS) _Pb
The RO3134A is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount, ceramic case.
It provides reliable, fundamental-mode, quartz frequency stabilization of local oscillators operating at
approximately 372.5 MHz.
RO3134A
372.5 MHz
SAW
Resonator
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
Soldering Temperature (10 seconds / 5 cycles maximum)
Value
+10
±30
-40 to +85
260
Units
dBm
VDC
°C
°C
SM5035-4
Electrical Characteristics
Characteristic
Frequency, +25 °C
Nominal Frequency
Tolerance from 372.500 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization
Sym
f_C
∆f_C
IL
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
L_TEST
Notes
2, 3, 4, 5
2, 5, 6
5, 6, 7
6, 7, 8
1, 6
5
5, 6, 7, 9
5, 6, 9
2, 7
Minimum
372.400
Typical
1.0
15,400
1,700
10
25
f_C
0.032
10
1.0
12.7
83
2.2
2.4
76
836//YYWWSR
Maximum
372.600
±100
2.2
Units
MHz
kHz
dB
40
°C
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Frequency aging is the change in f_C with time and is specified at +65
are subject to change without notice.
°C or less. Aging may exceed the specification for prolonged tempera- 7. Derived mathematically from one or more of the following directly
tures above +65 °C. Typically, aging is greatest the first year after
measured parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
2.
3.
4.
manufacture, decreasing in subsequent years.
The center frequency, f_C, is measured at the minimum insertion loss
point, IL_MIN, with the resonator in the 50 Ω test system (VSWR ≤
1.2:1). The shunt inductance, L_TEST, is tuned for parallel resonance
with C_O at f_C. Typically, f_OSCILLATOR or f_TRANSMITTER is approximately
equal to the resonator f_C.
One or more of the following United States patents apply: 4,454,488
and 4,616,197.
Typically, equipment utilizing this device requires emissions testing
8. Turnover temperature, T_O, is the temperature of maximum (or
turnover) frequency, f_O. The nominal frequency at any case
temperature, T_C, may be calculated from: f = f_O [1 - FTC (T_O -T_C)²].
Typically oscillator T_O is approximately equal to the specified
resonator T_O.
9. This equivalent RLC model approximates resonator performance near
the resonant frequency and is provided for reference only. The
capacitance C_O is the static (nonmotional) capacitance between the
and government approval, which is the responsibility of the equipment
two terminals measured at low frequency (10 MHz) with a capacitance
manufacturer.
meter. The measurement includes parasitic capacitance with "NC”
5. Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
6. The design, manufacturing process, and specifications of this device
pads unconnected. Case parasitic capacitance is approximately
0.05 pF. Transducer parallel capacitance can by calculated as:
C_P ≈ C_O - 0.05 pF.
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RO3134A - 6/29/11