RO3132A_14 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 312.0 MHz SAW Resonator

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RO3132A
• Designed for 312.0 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
Pb
• Complies with Directive 2002/95/EC (RoHS)
The RO3132A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount ceramic
case. It provides reliable, fundamental-mode quartz frequency stabilization of fixed-frequency transmitters
operating at 312.0 MHz. The RO3132A is designed specifically for remote-control and wireless security
transmitters.
Absolute Maximum Ratings
Rating
Value
Units
CW RF Power Dissipation (See: Typical Test Circuit)
+0
dBm
DC Voltage Between Terminals (Observe ESD Precautions)
±30
VDC
Case Temperature
-40 to +85
°C
Soldering Temperature (10 seconds / 5 cycles maximum)
260
°C
312.0 MHz
SAW
Resonator
SM5035-4
Electrical Characteristics
Characteristic
Center Frequency, +25 °C Absolute Frequency
Tolerance from 312.0 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Sym
f_C
f_C
IL
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
L_TEST
Notes
2,3,4,5
2,5,6
5,6,7
6,7,8
1
5
5, 7, 9
5, 6, 9
2, 7
Minimum
311.925
Typical
1.4
13500
2000
10
25
f_C
0.032
10
1.0
17.4
120
2.2
.74
351
794 // YYWWS
Maximum
312.075
±75
2.2
Units
MHz
kHz
dB
40
°C
ppm/°C²
ppm/yr
M

µH
fF
pF
nH
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1. Frequency aging is the change in f_C with time and is specified at +65 °C or
less. Aging may exceed the specification for prolonged temperatures
above +65 °C. Typically, aging is greatest the first year after manufacture,
decreasing in subsequent years.
2. The center frequency, f_C, is measured at the minimum insertion loss point,
IL_MIN, with the resonator in the 50  test system (VSWR  1.2:1). The
shunt inductance, L_TEST, is tuned for parallel resonance with C_O at f_C.
Typically, f_OSCILLATOR or f_TRANSMITTER is approximately equal to the
resonator f_C.
3. One or more of the following United States patents apply: 4,454,488 and
4,616,197.
4. Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment
manufacturer.
5. Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
6. The design, manufacturing process, and specifications of this device are
subject to change without notice.
7. Derived mathematically from one or more of the following directly
measured parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
8. Turnover temperature, T_O, is the temperature of maximum (or turnover)
frequency, f_O. The nominal frequency at any case temperature, T_C, may be
calculated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is
approximately equal to the specified resonator T_O.
9. This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C_O
is the static (nonmotional) capacitance between the two terminals
measured at low frequency (10 MHz) with a capacitance meter. The
measurement includes parasitic capacitance with "NC” pads unconnected.
Case parasitic capacitance is approximately 0.05 pF. Transducer parallel
capacitance can by calculated as: C_P  C_O - 0.05 pF.
10. Tape and Reel standard per ANSI / EIA 481.
©2010-2014 by Murata Electronics N.A., Inc.
RO3132A (R) 4/22/14
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