RO3073A-6 Datasheet, PDF (1/2 Pages) Murata Manufacturing Co., Ltd. – 315.050 MHz SAW Resonator

• Ideal for 315.0 MHz Transmitters
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS) Pb
The RO3073A-6 is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount, ceramic case.
It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency transmitters operat-
ing at 315.0 MHz. This SAW is designed specifically for remote control and wireless security transmitters.
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
Soldering Temperature (10 seconds / 5 cycles maximum)
Value
+0
±30
-40 to +85
260
Units
dBm
VDC
°C
°C
RO3073A-6
315.0 MHz
SAW
Resonator
SM5035-4
Electrical Characteristics
Characteristic
Center Frequency, +25 °C
Insertion Loss
Absolute Frequency
Tolerance from 315.0 MHz
Sym
f_C
∆f_C
IL
Notes
2,3,4,5
2,5,6
Minimum
314.950
Typical
1.5
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temperature Coefficient
Frequency Aging
Absolute Value during the First Year
DC Insulation Resistance between Any Two Terminals
RF Equivalent RLC Model Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
L_TEST
5,6,7
6,7,8
1
5
5, 7, 9
5, 6, 9
2, 7
8000
1300
10
25
f_C
0.032
≤10
1.0
19.4
78.4
3.3
4.1
64.2
789 // YWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
Maximum
315.050
±50
2.2
Units
MHz
kHz
dB
40
°C
ppm/°C²
ppm/yr
MΩ
Ω
µH
fF
pF
nH
1. Frequency aging is the change in f_C with time and is specified at +65 °C or less. 8. Turnover temperature, T_O, is the temperature of maximum (or turnover) fre-
Aging may exceed the specification for prolonged temperatures above +65 °C.
quency, f_O. The nominal frequency at any case temperature, T_C, may be calcu-
2.
Typically, aging is greatest the first year after manufacture, decreasing in subse-
quent years.
The center frequency, f_C, is measured at the minimum insertion loss point,
IL_MIN, with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt
9.
inductance, L_TEST, is tuned for parallel resonance with C_O at f_C. Typically, f_OS-
lated from: f = f_O [1 - FTC (T_O -T_C)²]. Typically oscillator T_O is approximately
equal to the specified resonator T_O.
This equivalent RLC model approximates resonator performance near the reso-
nant frequency and is provided for reference only. The capacitance C_O is the
static (nonmotional) capacitance between the two terminals measured at low
CILLATOR ^{or f}TRANSMITTER ^{is approximately equal to the resonator f}C^.
frequency (10 MHz) with a capacitance meter. The measurement includes para-
3. One or more of the following United States patents apply: 4,454,488 and
sitic capacitance with "NC” pads unconnected. Case parasitic capacitance is
4,616,197.
approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
4.
Typically, equipment utilizing this device requires emissions testing and govern-
ment approval, which is the responsibility of the equipment manufacturer.
C_P ≈ C_O - 0.05 pF.
10. Tape and Reel standard per ANSI / EIA 481.
5. Unless noted otherwise, case temperature T_C = +25 ± 2 °C.
6. The design, manufacturing process, and specifications of this device are subject
to change without notice.
7. Derived mathematically from one or more of the following directly measured
parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
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RO3073A-6 6/28/11