MSK613_15 Datasheet, PDF (2/4 Pages) M.S. Kennedy Corporation – Ultra Low Quiescent Current - ±10mA for High Voltage

ABSOLUTE MAXIMUM RATINGS
±VHV
±VIN
±VCC
θJC
Supply Voltage ±65V T ○
○
○
○
○
○
○
○
○
○
○
○
○
DC
ST
Input Voltage Range ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ±VCC TLD
Supply Voltage (Input Stage) ○ ○ ○ ○ ○ ±18VDC
Thermal Resistance ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 25°C/W TC
(Output Devices)
TJ
Storage Temperature Range -65°C to +150°C
Lead Temperature Range ○ ○ ○ ○ ○ ○ ○ ○ ○ 300°C
(10 Seconds)
Case Operating Temperature
MSK613 ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -40 °C to +85°C
MSK613H ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -55°C to +125°C
Junction Temperature ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 150°C
ELECTRICAL SPECIFICATIONS
Parameter
STATIC
Quiescent Current
Input Offset Voltage
Input Bias Current 2
Input Offset Voltage Drift 2
Power Supply Range 2
DYNAMIC CHARACTERISTICS
Output Voltage Swing
Peak Output Current 2
Full Power Output ²
Unity Gain Bandwidth 2
Slew Rate
Voltage Gain ²
Settling Time to 1% 2
Settling Time to 0.1% 2
Settling Time to 0.05% ²
Test Conditions 1
VIN=0 @ +VCC
VIN=0 @ -VCC
VIN=0 @ +VHV
VIN=0 @ -VHV
VIN=0
VIN=0
±VCC
±VHV
f=1KHz
f=1KHz
V0=±40V
V0=±1.0V
V0=±40V
VO=±40V f=1KHz
AV=-10V/V VO=±40V
AV=-10V/V VO=±40V
AV=-10V/V VO=±40V
Group A
MSK 613H
MSK 613 3
Subgroup Min. Typ. Max. Min. Typ. Max.
Units
1,2,3
1,2,3
1,2,3
1,2,3
1
2,3
1
2,3
2,3
-
-
-
1.0
-
12
-
10
-
12
- ±0.2
- ±1.0
-
50
- 100
- ±15
±12 ±15
±40 ±55
3.5
- 1.0
30
-
15
15
-
10
15
-
10
±5.0 - ±1.0
±10.0 - ±2.0
250
-
50
500
- 100
±50 - ±15
±18 ±12 ±15
±65 ±40 ±55
4.0
32
15
15
±5.0
-
500
-
-
±18
±65
mA
mA
mA
mA
mV
mV
nA
nA
µV/°C
V
V
4
±40 ±45
-
±40 ±45
-
V
-
±100 ±150
- ±100 ±150 -
mA
-
5
12
-
4 12
-
MHz
-
80 100
-
80 100
-
MHz
4
2000 3500
- 2000 3500 -
V/µS
4
90 100
-
90 100
-
dB
-
- 100
-
- 100
-
nS
-
- 400
-
- 400
-
nS
-
- 750 1.5
- 750 1.6
µS
NOTES:
1 Unless otherwise specified, ±VCC=±15VDC, ±VHV=±55VDC, CL=8pF (probe capacitance) and AV=10V/V.
2 This parameter is guaranteed by design but not tested. Typical parameters are representative of actual device performance but are for reference only.
3 Industrial grade devices shall be tested to subgroups 1 and 4 unless otherwise specified.
4 Military grade devices ('H' suffix) shall be 100% tested to subgroups 1,2,3 and 4.
5 Subgroup 1,4 TA=TC=+25°C
Subgroup 2,5 TA=TC=+125°C
Subgroup 3,6 TA=TC=-55°C
2
Rev. B 8/00