English
Language : 

MRF173 Datasheet, PDF (1/8 Pages) Motorola, Inc – N-CHANNEL BROADBAND RF POWER MOSFETs
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document
by MRF173/D
The RF MOSFET Line
RF Power
Field Effect Transistors
N–Channel Enhancement Mode MOSFETs
MRF173
MRF173CQ
Designed for broadband commercial and military applications up to 200 MHz
frequency range. The high–power, high–gain and broadband performance of
these devices make possible solid state transmitters for FM broadcast or TV
channel frequency bands.
• Guaranteed Performance at 150 MHz, 28 V:
Output Power = 80 W
Gain = 11 dB (13 dB Typ)
Efficiency = 55% Min. (60% Typ)
• Low Thermal Resistance
D
• Ruggedness Tested at Rated Output Power
• Nitride Passivated Die for Enhanced Reliability
• Low Noise Figure — 1.5 dB Typ at 2.0 A, 150 MHz
• Excellent Thermal Stability; Suited for Class A Operation G
S
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Drain–Source Voltage
Drain–Gate Voltage
Gate–Source Voltage
Drain Current — Continuous
Total Device Dissipation @ TC = 25°C
Derate above 25°C
VDSS
VDGO
VGS
ID
PD
65
Vdc
65
Vdc
±40
Vdc
9.0
Adc
220
Watts
1.26
W/°C
Storage Temperature Range
Operating Temperature Range
THERMAL CHARACTERISTICS
Tstg
–65 to +150
°C
TJ
200
°C
Characteristic
Thermal Resistance, Junction to Case
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Characteristic
Symbol
OFF CHARACTERISTICS
80 W, 28 V, 175 MHz
N–CHANNEL
BROADBAND
RF POWER MOSFETs
CASE 211–11, STYLE 2
(MRF173)
CASE 316–01, STYLE 2
(MRF173CQ)
Symbol
Max
RθJC
0.8
Min
Typ
Max
Unit
°C/W
Unit
Drain–Source Breakdown Voltage (VDS = 0 V, VGS = 0 V) ID = 50 mA
V(BR)DSS
65
—
—
V
Zero Gate Voltage Drain Current (VDS = 28 V, VGS = 0 V)
IDSS
—
—
2.0
mA
Gate–Source Leakage Current (VGS = 40 V, VDS = 0 V)
IGSS
—
—
1.0
µA
ON CHARACTERISTICS
Gate Threshold Voltage (VDS = 10 V, ID = 50 mA)
Drain–Source On–Voltage (VDS(on), VGS = 10 V, ID = 3.0 A)
Forward Transconductance (VDS = 10 V, ID = 2.0 A)
VGS(th)
1.0
3.0
6.0
V
VDS(on)
—
—
1.4
V
gfs
1.8
2.2
—
mhos
(continued)
NOTE — CAUTION — MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
REV 8
©MMOotoTrOolaR, OIncL.A19R97F DEVICE DATA
MRF173 MRF173CQ
1