PM50RSE060 Datasheet, PDF (5/6 Pages) Mitsubishi Electric Semiconductor – MITSUBISHI INTELLIGENT POWER MODULES FLAT-BASE TYPE INSULATED PACKAGE

MITSUBISHI <INTELLIGENT POWER MODULES>
PM50RSE060
FLAT-BASE TYPE
INSULATED PACKAGE
PRECAUTIONS FOR TESTING
1. Before appling any control supply voltage (VD), the input terminals should be pulled up by resistores, etc. to their corre-
sponding supply voltage and each input signal should be kept off state.
After this, the specified ON and OFF level setting for each input signal should be done.
2. When performing “OC” and “SC” tests, the turn-off surge voltage spike at the corresponding protection operation should not
be allowed to rise above VCES rating of the device.
(These test should not be done by using a curve tracer or its equivalent.)
P, (U,V,W,B)
P, (U,V,W)
IN
(Fo)
VCIN
(0V)
V
Ic
IN
VCIN
(Fo)
(15V)
V
–Ic
VD (all) ^{U,V,W, (N)}
Fig. 1 VCE(sat) Test
VD (all) ^{U,V,W,B, (N)}
Fig. 2 VEC, (VFM) Test
a) Lower Arm Switching
VCIN
(15V)
VCIN
Signal input
(Upper Arm)
Signal input
(Lower Arm)
b) Upper Arm Switching
VCIN
VCIN
(15V)
Signal input
(Upper Arm)
Signal input
(Lower Arm)
P
U,V,W
CS
Vcc
Fo
trr
Irr
90%
VD (all)
N
Ic
P
10%
10%
tc (on)
VCIN
U,V,W
CS
Vcc
td (on)
tr
Fo
(ton= td (on) + tr)
N
VD (all)
Ic
Fig. 3 Switching time Test circuit and waveform
VCE
Ic
90%
10%
tc (off)
10%
td (off)
tf
(toff= td (off) + tf)
VCIN
(15V)
P, (U,V,W,B)
A
VCIN
IN
(Fo)
Pulse VCE
Over Current
VD (all)
U,V,W, (N)
Fig. 4 ICES Test
P, (U,V,W,B)
IN
(Fo)
VCC
VCIN
U,V,W, (N)
VD (all)
IC
Fig. 5 OC and SC Test
OC
IC
toff (OC)
Constant Current
Short Circuit Current
Constant Current
SC
IC
Fig. 6 OC and SC Test waveform
P
VD
VCINP
U,V,W
Vcc
VD
VCINN
N
Ic
VCINP
0V
VCINN
0V
tdead
tdead
t
t
tdead
Fig. 7 Dead time measurement point example
Sep. 2001