PM50B6LB060 Datasheet, PDF (5/10 Pages) Mitsubishi Electric Semiconductor – FLAT-BASE TYPE INSULATED PACKAGE

MITSUBISHI <INTELLIGENT POWER MODULES>
PM50B6LB060
FLAT-BASE TYPE
INSULATED PACKAGE
PRECAUTIONS FOR TESTING
1. Before appling any control supply voltage (VD), the input terminals should be pulled up by resistores, etc. to their corre-
sponding supply voltage and each input signal should be kept off state.
After this, the specified ON and OFF level setting for each input signal should be done.
2. When performing “SC” tests, the turn-off surge voltage spike at the corresponding protection operation should not be al-
lowed to rise above VCES rating of the device.
(These test should not be done by using a curve tracer or its equivalent.)
P, (U,V,W,B)
P, (U,V,W,B)
IN
Fo
VCIN
(0V)
V
Ic
IN
VCIN
Fo
(15V)
V
–Ic
VD (all) ^{U,V, (N)}
Fig. 1 VCE(sat) Test
VD (all) ^{U,V,W,B, (N)}
Fig. 2 VEC, (VFM) Test
a) Lower Arm Switching
Fo
VCIN
Signal input
(15V) (Upper Arm)
Signal input ^Fo
VCIN
(Lower Arm)
P
U,V,W,B
CS
Vcc
trr
Irr
Ic
90%
VCE
90%
b) Upper Arm Switching ^{VD (all)}
Fo
VCIN
Signal input
(Upper Arm)
VCIN
(15V)
Signal input ^Fo
(Lower Arm)
VD (all)
N
Ic
P
10%
10%
tc(on)
10%
tc(off)
VCIN
U,V
CS
Vcc
td(on)
tr
td(off)
10%
tf
N
Ic
(ton= td(on) + tr)
(toff= td(off) + tf)
Fig. 3 Switching Time and SC Test Circuit
Fig. 4 Switching Time Test Waveform
VCIN
(15V)
P, (U,V,W,B)
A
IN
Fo
Pulse VCE
U,V,W,B, (N)
VD (all)
Fig. 5 ICES Test
VCIN
Ic
Short Circuit Current
Constant Current
SC Trip
Fo
toff(SC)
Fig. 6 SC Test Waveform
IPM’ input signal VCIN
(Upper Arm)
0V
1.5V
2V
1.5V
t
IPM’ input signal VCIN
(Lower Arm)
0V
2V
tdead
1.5V
2V
t
tdead
tdead
1.5V: Input on threshold voltage Vth(on) typical value, 2V: Input off threshold voltage Vth(off) typical value
Fig. 7 Dead Time Measurement Point Example
Oct. 2005