LX8384X-XX Datasheet, PDF (4/11 Pages) Microsemi Corporation – 5A Low Dropout Positive Regulators


A MICROSEMI COMPANY
LX8384x-xx
5A Low Dropout Positive Regulators
PRODUCTION
     

Unless otherwise specified, the following specifications apply over the operating ambient temperature for the LX8384x-xxC with
0°C ≤ T_A ≤ 125°C and the LX8384-xxI with -25°C ≤ T_A ≤ 125°C except where otherwise noted. Test conditions: V_IN -V_OUT = 3V;
I_OUT = 5A. Low duty cycle pulse testing techniques are used which maintains junction and case temperatures equal to the ambient
temperature.
Parameter
Symbol
Test Conditions

^{LX8384-15 / 8384A-15 / 8384B-15 (1.5V FIXED)(CONTINUED)}
Maximum Output Current
IOUT(MAX) VIN < 7V
Temperature Stability (Note 3)

OUT(T)
Long Term Stability (Note 3)

OUT (t) TA=125°C, 1000 hours
RMS Output Noise (% of VOUT)
(Note 3)
VOUT (RMS) TA=25°C, 10Hz < f < 10kHz

^{LX8384-33 / 8384A-33 / 8384B-33 (3.3V FIXED)}
Output Voltage
(Note 4)
LX8384/84A-33
LX8384B-33
VOUT
VIN=5V, IOUT=0mA, TA=25°C
4.75V < VIN < 10V, 0mA < IOUT < 5A, P < PMAX
VIN=5V, IOUT=0mA, TA=25°C
4.75V < VIN < 10V, 0mA < IOUT < 5A, P < PMAX
Line Regulation (Note 2)
Load Regulation (Note 2)
Thermal Regulation

OUT(VIN)

OUT
(IOUT)

OUT
(Pwr)
4.75V < VIN < 7V
4.75V < VIN < 10V
VIN=5V, 0mA < IOUT < IOUT(MAX)
TA=25°C, 20ms pulse
Ripple Rejection (Note 3)
COUT=100µF (Tantalum), IOUT=5A
Quiescent Current
IQ
0mA < IOUT < IOUT(MAX), 4.75V < VIN < 10V
Dropout Voltage LX8384-33



OUT=1%, IOUT < IOUT(MAX)
LX8384A/84B-33

OUT=1%, IOUT < IOUT(MAX)
Maximum Output Current
Temperature Stability (Note 3)
Long Term Stability (Note 3)
RMS Output Noise (% of VOUT)
(Note 3)
IOUT(MAX)

OUT (T)

OUT (t)
VIN < 7V
TA=125°C, 1000 hours
VOUT (RMS) TA=25°C, 10Hz < f < 10kHz
LX8384x-xx
Units
Min Typ Max
5
6
A
0.25
%
0.3
1
%
0.003
%
3.267 3.30 3.333 V
3.235 3.30 3.365 V
3.274 3.30 3.326 V
3.267 3.30 3.333 V
1
6
mV
2
10
mV
5
15
mV
0.01 0.02 % / W
60
83
dB
4
10
mA
1.2
1.5
V
1
1.3
V
5
6
A
0.25
%
0.3
1
%
0.003
%
Note 2
Note 3
Note 4
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output
voltage due to heating effects are covered under the specification for thermal regulation.
These parameters, although guaranteed are not tested in production.
See Maximum Output Current Section
Copyright © 2000
Rev. 2.1d, 2001-03-15
Microsemi
Linfinity Microelectronics Division
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: [phone]
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