APT50DL60BCT Datasheet, PDF (4/4 Pages) Microsemi Corporation – Ultrasoft Recovery Rectifi er Diode

+18V
0V
Vr
di_F/dt Adjust
D.U.T.
CURRENT
TRANSFORMER
Figure 9. Diode Test Circuit
APT50DL60BCT(G)
trr/Qrr
Waveform
1 I_F - Forward Conduction Current
2 di_F/dt - Rate of Diode Current Change Through Zero Crossing.
3 I_RRM - Maximum Reverse Recovery Current.
1
Zero
4 trr - Reverse Recovery Time, measured from zero crossing where diode
current goes from positive to negative, to the point at which the straight
2
line through I_RRM and 0.25 I_RRM passes through zero.
5 Qrr - Area Under the Curve Defined by I_RRM and trr.
6 di_M/dt - Maximum Rate of Current Increase During the Trailing Portion of trr.
Figure 10, Diode Reverse Recovery Waveform and Definitions
4
5
3
6
0.25 IRRM
Slope = di_M/dt
TO-247 (BCT) Package Outline
4.69 (.185)
5.31 (.209)
1.49 (.059)
2.49 (.098)
15.49 (.610)
16.26 (.640)
6.15 (.242) BSC
20.80 (.819)
21.46 (.845)
5.38 (.212)
6.20 (.244)
3.55 (.138)
3.81 (.150)
0.40 (.016)
0.79 (.031)
4.50 (.177) Max.
19.81 (.780)
20.32 (.800)
1.01 (.040)
1.40 (.055)
2.87 (.113)
3.12 (.123)
1.65 (.065)
2.13 (.084)
Anode 1
Common Cathode
Anode 2
2.21 (.087)
2.59 (.102)
5.45 (.215) BSC
2-Plcs.
Dimensions in Millimeters and (Inches)
Microsemi’s products are covered by one or more of U.S. patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583
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