APT56M50B2 Datasheet, PDF (2/4 Pages) Microsemi Corporation – APT56M50B2

Static Characteristics
T_J = 25°C unless otherwise specified
Symbol Parameter
Test Conditions
Min
V_BR(DSS)
Drain-Source Breakdown Voltage
V_GS = 0V, I_D = 250µA
500
∆V_BR(DSS)/∆T_{J Breakdown Voltage Temperature Coefficient}
R_DS(on)
Drain-Source On Resistance ³
Reference to 25°C, I_D = 250µA
V_GS = 10V, I_D = 28A
V_GS(th)
∆V_GS(th)/∆T_J
Gate-Source Threshold Voltage
Threshold Voltage Temperature Coefficient
V_GS = V_DS, I_D = 2.5mA
3
I_DSS
Zero Gate Voltage Drain Current
V_DS = 500V
V_GS = 0V
T_J = 25°C
T_J = 125°C
I_GSS
Gate-Source Leakage Current
V_GS = ±30V
Dynamic Characteristics
Symbol
g_fs
C_iss
C_rss
C_oss
Parameter
Forward Transconductance
Input Capacitance
Reverse Transfer Capacitance
Output Capacitance
T_J = 25°C unless otherwise specified
Test Conditions
Min
V_DS = 50V, I_D = 28A
V_GS = 0V, V_DS = 25V
f = 1MHz
C_o(cr) ⁴
Effective Output Capacitance, Charge Related
V_GS = 0V, V_DS = 0V to 333V
C_o(er) ⁵
Q_g
Q_gs
Q_gd
t_d(on)
t_r
t_d(off)
t_f
Effective Output Capacitance, Energy Related
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
C_o(er) =
-2.04E-7 4.76E-8
+
V_D²_S
V_DS
+ 1.36E-10
V_GS = 0 to 10V, I_D = 28A,
V_DS = 250V
Resistive Switching
V_DD = 333V, I_D = 28A
R_G = 4.7Ω ⁶ , V_GG = 15V
APT56M50B2_L
Typ Max Unit
V
0.60
V/°C
0.085 0.10
Ω
4
5
V
-10
mV/°C
100
µA
500
±100 nA
Typ Max Unit
42
S
8800
120
945
550
pF
275
220
50
nC
100
38
45
ns
100
33
Source-Drain Diode Characteristics
Symbol Parameter
I_S
Continuous Source Current
(Body Diode)
I_SM
Pulsed Source Current
(Body Diode) ¹
V_SD
Diode Forward Voltage
t_rr
Reverse Recovery Time
Q_rr
Reverse Recovery Charge
dv/dt
Peak Recovery dv/dt
Test Conditions
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
D
G
S
I_SD = 28A, T_J = 25°C, V_GS = 0V
I_SD = 28A ³
di_SD/dt = 100A/µs, T_J = 25°C
I_SD ≤ 28A, di/dt ≤1000A/µs, V_DD = 333V,
T_J = 125°C
Min
Typ
660
13.2
Max
100
200
1
8
Unit
A
V
ns
µC
V/ns
1 Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
2 Starting at T_J = 25°C, L = 3.06mH, R_G = 4.7Ω, I_AS = 28A.
3 Pulse test: Pulse Width < 380µs, duty cycle < 2%.
4 C_o(cr) is defined as a fixed capacitance with the same stored charge as C_OSS with V_DS = 67% of V_DSS.
5 C_o(er) is defined as a fixed capacitance with the same stored energy as C_OSS with V_DS = 67% of V_DSS. The equation in the test conditions
box can be used to calculate C_o(er) for any value of V_DS less than V_DSS.
6 R_G is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemi reserves the right to change, without notice, the specifications and information contained herein.