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HAL182Y Datasheet, PDF (2/2 Pages) Micronas – Linear Hall-Effect Sensor Family
PRODUCT INFORMATION
HAL 1821/1822/1823
July/2009
System Architecture
The HAL 1821/1822/1823 sensors are pro-
duced in a proven submicron CMOS tech-
nology.
The HAL 1821/1822/1823 feature a temper-
VDD
ature-compensated Hall plate with chop-
pered offset compensation, an A/D con-
verter, digital signal processing, an analog
output and protection devices on all pins.
The internal digital signal processing is a
great benefit because analog offsets, tem-
perature shifts, and mechanical stress do
not degrade the sensor accuracy.
Internally
stabilized
Supply and
Protection
Devices
Temperature
Dependent
Bias
Oscillator
Switched
Hall Plate
A/D
Converter
Digital
Signal
Processing
Overvoltage,
Undervoltage
Detection
Protection
Devices
50
D/A
Analog
Converter
Output
OUT
GND
Calibration Control
Fig. 1: Block diagram of the HAL 1821/1822/1823
All information and data contained in this product information are without any commitment, are not to be consid-
ered as an offer for conclusion of a contract, nor shall they be construed as to create any liability. Product or
development sample availability and delivery are exclusively subject to our respective order confirmation form. By
this publication, Micronas GmbH does not assume responsibility for patent infringements or other rights of third
parties which may result from its use.
No part of this publication may be reproduced, photo-
copied, stored on a retrieval system, or transmitted
without the express written consent of Micronas GmbH.
Edition July, 14, 2009; Order No. PI000135_001EN
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