JS28F256M29EWHA Datasheet, PDF (36/75 Pages) Micron Technology – Parallel NOR Flash Embedded Memory

256Mb, 512Mb, 1Gb, 2Gb: 3V Embedded Parallel NOR Flash
BLANK CHECK Operation
The BLANK CHECK operation checks for cells that are programmed or over-erased. If it
finds any, it returns a failure status, indicating that the block is not blank. If it returns a
passing status, the block is guaranteed blank (all 1s) and is ready to program.
Before executing, the ERASE operation initiates a BLANK CHECK operation, and if the
target block is blank, the ERASE operation is skipped, benefitting overall cycle perform-
ance; otherwise, the ERASE operation continues.
The BLANK CHECK operation can occur in only one block at a time, and during its exe-
cution, reading the status register is the only other operation allowed. Reading from any
address in the device enables reading the status register to monitor blank check pro-
gress or errors. Operations such as READ (array data), PROGRAM, ERASE, and any sus-
pended operation are not allowed.
After the BLANK CHECK operation has completed, the device returns to read mode un-
less an error has occurred. When an error occurs, the device continues to output status
register data. A READ/RESET command must be issued to reset the error condition and
return the device to read mode.
PDF: 09005aef849b4b09
m29ew_256mb_2gb.pdf - Rev. B 8/12 EN
36
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