93AA46A_07 Datasheet, PDF (5/38 Pages) Microchip Technology – 1K-16K Microwire Compatible Serial EEPROMs

93XX46X/56X/66X/76X/86X
TABLE 2-2: AC CHARACTERISTICS
All parameters apply over the specified
ranges unless otherwise noted.
VCC = 1.8V to 5.5V
Industrial (I): TA = -40°C to +85°C
Automotive (E): TA = -40°C to +125°C
Param.
No.
Symbol
Parameter
Min.
Max. Units
Conditions
A1
FCLK
Clock frequency
—
3
MHz 4.5V ≤ VCC < 5.5V
2
MHz 2.5V ≤ VCC < 4.5V
1
MHz 1.8V ≤ VCC < 2.5V
A2
TCKH
Clock high time
200
—
ns 4.5V ≤ VCC < 5.5V
250
ns 2.5V ≤ VCC < 4.5V
450
ns 1.8V ≤ VCC < 2.5V
A3
TCKL
Clock low time
100
—
ns 4.5V ≤ VCC < 5.5V
200
ns 2.5V ≤ VCC < 4.5V
450
ns 1.8V ≤ VCC < 2.5V
A4
TCSS
Chip Select setup time
50
—
ns 4.5V ≤ VCC < 5.5V
100
ns 2.5V ≤ VCC < 4.5V
250
ns 1.8V ≤ VCC < 2.5V
A5
TCSH Chip Select hold time
0
—
ns 1.8V ≤ VCC < 5.5V
A6
TCSL
Chip Select low time
250
—
ns 1.8V ≤ VCC < 5.5V
A7
TDIS
Data input setup time
50
—
ns 4.5V ≤ VCC < 5.5V
100
ns 2.5V ≤ VCC < 4.5V
250
ns 1.8V ≤ VCC < 2.5V
A8
TDIH
Data input hold time
50
—
ns 4.5V ≤ VCC < 5.5V
100
ns 2.5V ≤ VCC < 4.5V
250
ns 1.8V ≤ VCC < 2.5V
A9
TPD
Data output delay time
—
100
ns 4.5V ≤ VCC < 5.5V, CL = 100 pF
(93C76X/86X)
—
200
ns 4.5V ≤ VCC < 5.5V, CL = 100 pF
250
ns 2.5V ≤ VCC < 4.5V, CL = 100 pF
400
ns 1.8V ≤ VCC < 2.5V, CL = 100 pF
A10 TCZ
Data output disable time
—
100
ns 4.5V ≤ VCC < 5.5V, (Note 1)
200
ns 1.8V ≤ VCC < 4.5V, (Note 1)
A11 TSV
Status valid time
—
200
ns 4.5V ≤ VCC < 5.5V, CL = 100 pF
300
ns 2.5V ≤ VCC < 4.5V, CL = 100 pF
500
ns 1.8V ≤ VCC < 2.5V, CL = 100 pF
A12 TWC
Program cycle time
—
5
ms Erase/Write mode
93XX76X/86X
(AA and LC versions)
—
6
ms 93XX46X/56X/66X
(AA and LC versions)
A13 TWC
—
2
ms 93C46X/56X/66X/76X/86X
A14 TEC
Program cycle time
—
6
ms ERAL mode, 4.5V ≤ VCC ≤ 5.5V
A15 TWL
—
15
ms WRAL mode, 4.5V ≤ VCC ≤ 5.5V
A16 —
Endurance
1M
— cycles 25°C, VCC = 5.0V, (Note 2)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This application is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which may be downloaded from Microchip’s web
site at www.microchip.com.
© 2007 Microchip Technology Inc.
DS21929D-page 5