RE46C141S16F Datasheet, PDF (4/12 Pages) Microchip Technology – A Subsidiary of Microchip Technology Inc.

RE46C141
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
AC Electrical Characteristics at TA =-25° to 75°, VDD=9V, VSS=0V, Component Values from Figure 2 ;
R9=100KΩ, R12=10MΩ, C5= 1.5nF(unless otherwise noted)
Parameter
Oscillator Period
LED and STROBE On Time
LED Period
STROBE and IRED Pulse
Period
IRED On Time
Horn On Time
Horn Off Time
IO Charge Dump Duration
IO Delay
IO Filter
Remote Alarm Delay
Symbol
T_POSC
T_ON1
T_PLED1
T_PLED2
T_PLED4
T_PER1
T_PER1A
T_PER1B
T_PER2
T_PER3
T_PER4
T_PER5
T_ON2
T_HON1
T_HON2
T_HOF1
T_HOF2
T_HOF3
T_IODMP
T_IODLY1
T_IOFILT
T_IODLY2
Test
Pin
12
11,4
11
11
11
4,6
4,6
4,6
4,6
4,6
4,6
4,6
6
8,9
8,9
8,9
8,9
8,9
7
7
7
7
Test Conditions
No Alarm Condition, Note 2
Operating
Standby, No Alarm
Local Alarm Condition
Remote Alarm Only
Standby, No Alarm
Standby, After 1 Valid Smoke
Sample
Standby, After 2 Consecutive Valid
Smoke Samples
In Local Alarm – (3 Consecutive
Valid Smoke Samples)
In Remote Alarm
Pushbutton Test
Chamber Test or Low Battery
Test, no Alarms
Operating, Note 2
Operating, Alarm Condition, Note 1
Low Battery or Failed Chamber
Test , No Alarm
Operating, Alarm Condition, Note 1
Operating, Alarm Condition, Note 1
Low Battery or Failed Chamber
Test, No Alarm
At Conclusion of Local Alarm or
Test
From Start of Local Alarm to IO
Active
IO pulse width guaranteed to be
filtered. IO as Input, No Local
Alarm
No Local Alarm, From IO Active
Horn Active
Limits
Min Typ Max
7.1
7.9
8.6
7.1
7.9
8.6
28.8 32.4 35.2
.45
.5
.55
LED IS NOT ON
7.3
8.1
8.8
1.8
2
2.2
Units
mS
mS
S
S
S
S
S
.9
1
1.1
S
.9
1
1.1
S
7.3
8.1
8.8
S
250
mS
28.8
35.2
S
94
104 115
uS
450 500 550 mS
7.1
7.9
8.6
mS
450 500 550 mS
1.35 1.5 1.65
S
28.8 32.4 35.2
S
.68
1.1
S
0
S
450 mS
.9
1.65
S
Note 1 - See timing diagram for Horn Temporal Pattern
Note 2 - T_POSC and T_ON2 are 100% production tested. All other timing is guaranteed by functional testing.
Typical values are for design information and are not guaranteed.
Limits over the specified temperature range are not production tested and are based on characterization data.
© 2009 Microchip Technology Inc.
DS22177B-page 4