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93LC46BT-SN Datasheet, PDF (4/38 Pages) Microchip Technology – 1K Microwire Compatible Serial EEPROM | |||
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93AA46A/B/C, 93LC46A/B/C, 93C46A/B/C
TABLE 1-2: AC CHARACTERISTICS
All parameters apply over the specified
ranges unless otherwise noted.
Industrial (I): TA = -40°C to +85°C, VCC = +1.8V TO +5.5V
Automotive (E): TA = -40°C to +125°C, VCC = +2.5V TO +5.5V
Param.
No.
Symbol
Parameter
Min. Max. Units
Conditions
A1
FCLK Clock frequency
â
3 MHz 4.5Vï ï£ï VCC ï¼ 5.5V, 93XX46C only
2 MHz 2.5V ï£ï VCC ï¼ 5.5V
1 MHz 1.8V ï£ï VCC ï¼ï 2.5V
A2
TCKH Clock high time
200 â
250
450
ns 4.5Vï ï£ï VCC ï¼ 5.5V, 93XX46C only
ns 2.5V ï£ï VCC ï¼ 5.5V
ns 1.8V ï£ï VCC ï¼ï 2.5V
A3
TCKL Clock low time
100 â
200
450
ns 4.5Vï ï£ï VCC ï¼ 5.5V, 93XX46C only
ns 2.5V ï£ï VCC ï¼ 5.5V
ns 1.8V ï£ï VCC ï¼ï 2.5V
A4
TCSS Chip Select setup time
50
â
ns 4.5Vï ï£ï VCC ï¼ 5.5V
100
ns 2.5V ï£ï VCC ï¼ 4.5V
250
ns 1.8V ï£ï VCC ï¼ï 2.5V
A5
TCSH Chip Select hold time
0
â
ns 1.8V ï£ï VCC ï¼ï 5.5V
A6
TCSL Chip Select low time
250 â
ns 1.8V ï£ï VCC ï¼ï 5.5V
A7
TDIS Data input setup time
50
â
ns 4.5Vï ï£ï VCC ï¼ 5.5V, 93XX46C only
100
2.5V ï£ï VCC ï¼ 5.5V
250
1.8V ï£ï VCC ï¼ï 2.5V
A8
TDIH Data input hold time
50
â
ns 4.5Vï ï£ï VCC ï¼ 5.5V, 93XX46C only
100
2.5V ï£ï VCC ï¼ 5.5V
250
1.8V ï£ï VCC ï¼ï 2.5V
A9
TPD
Data output delay time
â 200 ns 4.5Vï ï£ï VCC ï¼ 5.5V, CL = 100 pF
â 250
2.5V ï£ï VCC ï¼ 4.5V, CL = 100 pF
â 400
1.8V ï£ï VCC ï¼ï 2.5V, CL = 100 pF
A10
TCZ
Data output disable time
â 100 ns 4.5Vï ï£ï VCC ï¼ï 5.5V, (Note 1)
â 200
1.8Vï ï£ï VCC ï¼ 4.5V, (Note 1)
A11
TSV
Status valid time
â 200 ns 4.5Vï ï£ï VCC ï¼ 5.5V, CL = 100 pF
300
2.5V ï£ï VCC ï¼ 4.5V, CL = 100 pF
500
1.8V ï£ï VCC ï¼ï 2.5V, CL = 100 pF
A12
TWC
Program cycle time
â
6
ms Erase/Write mode (AA and LC
versions)
A13
TWC
â
2
ms Erase/Write mode (93C versions)
A14
TEC
â
6
ms ERAL mode, 4.5V ï£ VCC ï£ 5.5V
A15
TWL
â
15
ms WRAL mode, 4.5V ï£ VCC ï£ 5.5V
A16
â
Endurance
1M
â cycles 25°C, VCC = 5.0V, (Note 2)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This application is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance⢠Model, which may be obtained from Microchipâs web
site at www.microchip.com.
DS20001749K-page 4
ï£ 2002-2013 Microchip Technology Inc.
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