TC4421A Datasheet, PDF (3/22 Pages) Microchip Technology – 9A High-Speed MOSFET Drivers

1.0 ELECTRICAL
CHARACTERISTICS
Absolute Maximum Ratings †
Supply Voltage ..................................................... +20V
Input Voltage .................... (V_DD + 0.3V) to (GND – 5V)
Input Current (V_IN > V_DD)................................... 50 mA
TC4421A/TC4422A
† Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the
operation sections of the specifications is not implied.
Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability.
DC CHARACTERISTICS
Electrical Specifications: Unless otherwise noted, T_A = +25°C with 4.5V ≤ V_DD ≤ 18V.
Parameters
Sym
Min
Typ Max Units
Conditions
Input
Logic ‘1’, High Input Voltage
V_IH
Logic ‘0’, Low Input Voltage
V_IL
Input Current
I_IN
Input Voltage
V_IN
Output
2.4
1.8
—
V
—
1.3
0.8
V
–10
—
+10
µA 0V ≤ V_IN ≤ V_DD
–5
— V_DD – 0.3 V
High Output Voltage
Low Output Voltage
Output Resistance, High
Output Resistance, Low
Peak Output Current
Continuous Output Current
V_OH
V_OL
R_OH
R_OL
I_PK
I_DC
V_DD – 0.025 —
—
—
—
1.25
—
0.8
—
10.0
2
—
—
0.025
1.5
1.1
—
—
V DC Test
V DC Test
Ω I_OUT = 10 mA, V_DD = 18V
Ω I_OUT = 10 mA, V_DD = 18V
A V_DD = 18V
A 10V ≤ V_DD ≤ 18V, T_A = +25°C
(TC4421A/TC4422A CAT only)
(Note 2)
Latch-Up Protection
I_REV
Withstand Reverse Current
—
>1.5
—
A Duty cycle ≤ 2%, t ≤ 300 µsec
Switching Time (Note 1)
Rise Time
Fall Time
Propagation Delay Time
Propagation Delay Time
Power Supply
t_R
—
28
34
ns Figure 4-1, C_L = 10,000 pF
t_F
—
26
32
ns Figure 4-1, C_L = 10,000 pF
t_D1
—
38
45
ns Figure 4-1, C_L = 10,000 pF
t_D2
—
42
49
ns Figure 4-1, C_L = 10,000 pF
Power Supply Current
I_S
—
—
Operating Input Voltage
V_DD
4.5
Note 1: Switching times ensured by design.
130
250
µA V_IN = 3V
35
100
µA V_IN = 0V
—
18
V
2: Tested during characterization, not production tested.
© 2005 Microchip Technology Inc.
DS21946A-page 3