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TC1070 Datasheet, PDF (3/16 Pages) TelCom Semiconductor, Inc – 50mA ADJUSTABLE CMOS LDO WITH SHUTDOWN
TC1070/TC1071/TC1187
TC1070/TC1071/TC1187 ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics: VIN = VOUT + 1V, IL = 0.1mA, CL = 3.3µF, SHDN > VIH, TA = 25°C, unless otherwise noted. Boldface
type specifications apply for junction temperatures of -40°C to +125°C.
Symbol
Parameter
Min
Typ
Max
Units
Test Conditions
SHDN Input
VIH
VIL
ADJ Input
SHDN Input High Threshold
SHDN Input Low Threshold
45
—
—
%VIN VIN = 2.5V to 6.5V
—
—
15
%VIN VIN = 2.5V to 6.5V
IADJ
Adjust Input Leakage Current
—
50
—
pA
Note 1: TC VOUT = (VOUTMAX – VOUTMIN) x 106
VOUT x ∆T
2: Regulation is measured at a constant junction temperature using low duty cycle pulse testing. Load regulation is tested over a load range
from 0.1mA to the maximum specified output current. Changes in output voltage due to heating effects are covered by the thermal
regulation specification.
3: Dropout voltage is defined as the input to output differential at which the output voltage drops 2% below its nominal value.
4: Thermal Regulation is defined as the change in output voltage at a time T after a change in power dissipation is applied, excluding load or
line regulation effects. Specifications are for a current pulse equal to ILMAX at VIN = 6V for T = 10 msec.
5: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction temperature and the
thermal resistance from junction-to-air (i.e., TA, TJ, θJA). Exceeding the maximum allowable power dissipation causes the device to initiate
thermal shutdown. Please see Section 4.0 Thermal Considerations for more details.
6: The minimum VIN has to justify the conditions: VIN ≥ VR + VDROPOUT and VIN ≥ 2.7V for IL = 0.1mA to IOUTMAX.
© 2002 Microchip Technology Inc.
DS21353B-page 3