93AA46_04 Datasheet, PDF (3/22 Pages) Microchip Technology – 1K/2K/4K 1.8V Microwire Serial EEPROM

93AA46/56/66
TABLE 1-1: DC AND AC ELECTRICAL CHARACTERISTICS
VCC = +1.8V to +5.5V Commercial (C): TA = 0°C to +70°C
Industrial (I): TA = -40°C to +85°C
Parameter
Symbol Min
Typ
Max
Units
Conditions
High-level input voltage
VIH1
2.0
—
VCC+1
VIH2 0.7 VCC
—
VCC+1
Low-level input voltage
VIL1
-0.3
—
0.8
VIL2
-0.3
—
0.2 VCC
Low-level output voltage
VOL1
—
—
0.4
VOL2
—
—
0.2
High-level output voltage VOH1
2.4
—
—
VOH2 VCC-0.2
—
—
Input leakage current
ILI
-10
—
10
Output leakage current
ILO
-10
—
10
Pin capacitance
CIN, COUT —
—
7
(all inputs/outputs)
Operating current
ICC write —
—
3
V
VCC ≥ 2.7V
V
VCC < 2.7V
V
VCC ≥ 2.7V
V
VCC < 2.7V
V
IOL = 2.1 mA; VCC = 4.5V
V
IOL = 100µA; VCC = 1.8V
V
IOH = -400 µA; VCC = 4.5V
V
IOH = -100 µA; VCC = 1.8V
µA
VIN = 0.1V to VCC
µA
VOUT = 0.1V to VCC
pF
VIN/VOUT = 0V (Note 1 & 2)
TA = +25°C, FCLK = 1 MHz
mA
FCLK = 2 MHz; VCC=5.5V
(Note 2)
ICC read
—
—
1
500
70
mA
FCLK = 2 MHz; VCC = 5.5V
µA
FCLK = 1 MHz; VCC = 3.0V
µA
FCLK = 1 MHz; VCC = 1.8V
Standby current
ICCS
100
µA
CLK = CS = 0V; VCC = 5.5V
30
µA
CLK = CS = 0V; VCC = 3.0V
2
µA
CLK = CS = 0V; VCC = 1.8V
ORG, DI = VSS or VCC
Clock frequency
FCLK
2
MHz VCC ≥ 4.5V
1
MHz VCC < 4.5V
Clock high time
TCKH
250
ns
Clock low time
TCKL
250
ns
Chip select setup time
TCSS
50
ns
Relative to CLK
Chip select hold time
TCSH
0
ns
Relative to CLK
Chip select low time
TCSL
250
ns
Data input setup time
TDIS
100
ns
Relative to CLK
Data input hold time
TDIH
100
ns
Relative to CLK
Data output delay time
TPD
400
ns
CL = 100 pF
Data output disable time
TCZ
100
ns
CL = 100 pF (Note 2)
Status valid time
TSV
500
ns
CL = 100 pF
Program cycle time
TWC
4
10
ms
Erase/Write mode
TEC
8
15
ms
ERAL mode (Vcc = 5V ± 10%)
TWL
16
30
ms
WRAL mode (Vcc = 5V ± 10%)
Endurance
—
1M
—
1M
—
25°C, Vcc = 5.0V, Block mode
(Note 3)
Note 1: This parameter is tested at TA = 25°C and FCLK = 1 MHz.
2: This parameter is periodically sampled and not 100% tested.
3: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from Microchip’s web site.
 2004 Microchip Technology Inc.
DS20067J-page 3