93C56A Datasheet, PDF (2/12 Pages) Microchip Technology – 2K 5.0V Automotive Temperature Microwire Serial EEPROM

93C56A/B
1.0 ELECTRICAL
CHARACTERISTICS
1.1 Maximum Ratings*
VCC ...................................................................................7.0V
All inputs and outputs w.r.t. VSS ................ -0.6V to Vcc +1.0V
Storage temperature .....................................-65°C to +150°C
Ambient temp. with power applied.................-65°C to +125°C
Soldering temperature of leads (10 seconds) ............. +300°C
ESD protection on all pins................................................4 kV
*Notice: Stresses above those listed under “Maximum ratings” may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at those or any other conditions
above those indicated in the operational listings of this specification is
not implied. Exposure to maximum rating conditions for extended peri-
ods may affect device reliability.
TABLE 1-1: PIN FUNCTION TABLE
Name
Function
CS
Chip Select
CLK Serial Data Clock
DI
Serial Data Input
DO
Serial Data Output
VSS
Ground
NC
No Connect
VCC
Power Supply
TABLE 1-2: DC AND AC ELECTRICAL CHARACTERISTICS
All parameters apply over the ^{Automotive (E)VCC = +4.5V to +5.5VTamb = -40°C to +125°C}
specified operating ranges
unless otherwise noted
Parameter
Symbol Min.
Max.
Units
Conditions
High level input voltage
VIH
2.0
VCC +1
V (Note 2)
Low level input voltage
VIL
-0.3
0.8
V
Low level output voltage
VOL
—
0.4
V IOL = 2.1 mA; VCC = 4.5V
High level output voltage
VOH
2.4
—
V
IOH = -400 µA; VCC = 4.5V
Input leakage current
ILI
-10
10
µA VIN = VSS to VCC
Output leakage current
ILO
-10
10
µA VOUT = VSS to VCC
Pin capacitance
(all inputs/outputs)
CIN, COUT —
7
pF
VIN/VOUT = 0 V (Notes 1 & 2)
Tamb = +25°C, FCLK = 1 MHz
Operating current
ICC write
—
ICC read
—
1.5
mA
1
mA
Standby current
ICCS
—
1
µA CS = VSS
Clock frequency
FCLK
—
2
MHz
Clock high time
TCKH
250
—
ns
Clock low time
TCKL
250
—
ns
Chip select setup time
TCSS
50
—
ns Relative to CLK
Chip select hold time
TCSH
0
—
ns Relative to CLK
Chip select low time
TCSL
250
—
ns
Data input setup time
TDIS
100
—
ns Relative to CLK
Data input hold time
TDIH
100
—
ns Relative to CLK
Data output delay time
TPD
—
400
ns CL = 100 pF
Data output disable time
TCZ
—
100
ns CL = 100 pF (Note 2)
Status valid time
TSV
—
500
ns CL = 100 pF
TWC
—
2
ms ERASE/WRITE mode
Program cycle time
TEC
—
6
ms ERAL mode
TWL
—
15
ms WRAL mode
Endurance
—
100K
—
cycles 25°C, VCC = 5.0V, Block Mode (Note 3)
Note 1: This parameter is tested at Tamb = 25°C and FCLK = 1 MHz.
2: This parameter is periodically sampled and not 100% tested.
3: This application is not tested but guaranteed by characterization. For endurance estimates in a specific
application, please consult the Total Endurance Model which may be obtained on Microchip’s BBS or web-
site.
DS21206B-page 2
Preliminary
© 1998 Microchip Technology Inc.