HCS512_02 Datasheet, PDF (15/26 Pages) Microchip Technology – KEELOQ® Code Hopping Decoder

HCS512
9.0 ELECTRICAL CHARACTERISTICS FOR HCS512
Absolute Maximum Ratings †
Ambient temperature under bias.............................................................................................................-55°C to +125°C
Storage temperature ...............................................................................................................................-65°C to +150°C
Voltage on any pin with respect to VSS (except VDD) ............................................................................ -0.6V to VDD +0.6V
Voltage on VDD with respect to Vss....................................................................................................................0 to +7.5V
Total power dissipation (Note 1) ..........................................................................................................................800 mW
Maximum current out of VSS pin.............................................................................................................................150 mA
Maximum current into VDD pin................................................................................................................................100 mA
Input clamp current, Iik (VI < 0 or VI > VDD) ............................................................................................................ ± 20 mA
Output clamp current, IOK (VO < 0 or VO >VDD) .................................................................................................... ± 20 mA
Maximum output current sunk by any I/O pin..........................................................................................................25 mA
Maximum output current sourced by any I/O pin ....................................................................................................20 mA
Note: Power dissipation is calculated as follows: Pdis = VDD x {IDD - ∑ IOH} + ∑ {(VDD–VOH) x IOH} + ∑(VOl x IOL)
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above
those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
© 2002 Microchip Technology Inc.
DS40151D-page 15