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MCP87130 Datasheet, PDF (1/18 Pages) Microchip Technology – High-Speed N-Channel Power MOSFET | |||
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MCP87130
High-Speed N-Channel Power MOSFET
Features:
⢠Low Drain-to-Source On Resistance (RDS(ON))
⢠Low Total Gate Charge (QG) and Gate-to-Drain
Charge (QGD)
⢠Low Series Gate Resistance (RG)
⢠Capable of Short Dead-Time Operation
⢠RoHS Compliant
Applications:
⢠Point-of-Load DC-DC Converters
⢠High Efficiency Power Management in Servers,
Networking, and Automotive Applications
Description:
The MCP87130 is an N-Channel power MOSFET in a
popular PDFN 5 mm x 6 mm package as well as a
PDFN 3.3 mm x 3.3 mm package. Advanced
packaging and silicon processing technologies allow
the MCP87130 to achieve a low QG for a given RDS(ON)
value, resulting in a low Figure of Merit (FOM).
Combined with low RG, the low FOM of the MCP87130
allows high efficiency power conversion with reduced
switching and conduction losses.
Package Type
PDFN 5 x 6
PDFN 3.3 x 3.3
S1
8D
S2
7D
S3
6D
G4
5D
Product Summary Table: Unless otherwise indicated, TA = +25ËC.
Parameters
Sym Min Typ Max Units
Conditions
Operating Characteristics
Drain-to-Source Breakdown Voltage
Gate-to-Source Threshold Voltage
Drain-to-Source On Resistance
Total Gate Charge
Gate-to-Drain Charge
Series Gate Resistance
BVDSS 25
â
â
V VGS = 0V, ID = 250 µA
VGS(TH) 1.1 1.35 1.7
V VDS = VGS, ID = 250 µA
RDS(ON) â 13.8 16.5 m⦠VGS = 4.5V, ID = 10A
â 11.3 13.5 m⦠VGS = 10V, ID = 10A
QG
QGD
â 5.5 8
â 2.6 â
nC VDS = 12.5V, ID = 10A,
VGS = 4.5V
nC VDS = 12.5V, ID = 10A
RG
â 1.7 â
â¦
Thermal Characteristics
Thermal Resistance Junction-to-X, 8L 3.3x3.3-PDFN
RθJX
â â 66 °C/W Note 1
Thermal Resistance Junction-to-Case, 8L 3.3x3.3-PDFN
RθJC
â â 3.5 °C/W Note 2
Thermal Resistance Junction-to-X, 8L 5x6-PDFN
RθJX
â â 56 °C/W Note 1
Thermal Resistance Junction-to-Case, 8L 5x6-PDFN
RθJC
â â 2.1 °C/W Note 2
Note 1: RθJX is determined with the device surface mounted on a 4-Layer FR4 PCB, with a 1â x 1â mounting pad of 2 oz. cop-
per. This characteristic is dependent on userâs board design.
2: RθJC is determined using JEDEC 51-14 Method. This characteristic is determined by design.
ï£ 2013 Microchip Technology Inc.
DS25159A-page 1
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