PL620-88 Datasheet, PDF (3/6 Pages) Micrel Semiconductor – Low Phase Noise XO (9.5-65MHz Output)

2. Crystal Specifications
PARAMETERS
Crystal Resonator Frequency
Crystal Loading Rating
Interelectrode Capacitance
Recommended ESR
PL620-88/-89
Low Phase Noise XO (9.5-65MHz Output)
SYMBOL
CONDITIONS
F_XIN
C_{L (xtal)}
C₀
R_E
Fundamental
AT cut
MIN TYP MAX UNITS
19
65 MHz
8.5
pF
5
pF
30
Ω
3. General Electrical Specifications
PARAMETERS
SYMBOL
CONDITIONS
MIN
Supply Current (Loaded Outputs) I_DD LVPECL/LVDS, 15pF Load
Operating Voltage
V_DD
2.25
Output Clock Duty Cycle
@ 1.25V (LVDS)
@ V_DD – 1.3V (LVPECL)
45
Short Circuit Current
TYP MAX UNITS
100/80 mA
3.63
V
50
55
%
50
mA
4. Jitter Specifications
PARAMETERS
Period jitter RMS at 27MHz
Period jitter peak-to-peak at 27MHz
Accumulated jitter RMS at 27MHz
Accumulated jitter pk-to-pk at 27MHz
Random Jitter
Measured on Wavecrest SIA 3000
CONDITIONS
With capacitive decoupling
between V_DD and GND. Over
10,000 cycles
With capacitive decoupling
between V_DD and GND. Over
1,000,000 cycles.
“RJ” measured on Wavecrest
SIA 3000
5. Phase Noise Specifications
PARAMETERS FREQUENCY @10Hz
Phase Noise
relative to carrier
27MHz
-75
Note: Phase Noise measured on Agilent E5500
@100Hz
-100
@1kHz
-125
MIN TYP MAX UNITS
2.3
ps
18.5
20
2.3
ps
24
25
2.3
ps
@10kHz
-140
@100kHz UNITS
-145 dBc/Hz
Micrel Inc. • 2180 Fortune Drive • S an Jose, CA 95131 • USA • tel [phone] • fax [phone] • www.micrel.com Rev 4/28/09 Page 3